Issued Patents All Time
Showing 26–46 of 46 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10237048 | Method and apparatus for scheduling data in a wireless communication system | Young-Bum Kim, Gert Jan Van Lieshout, Yong-Jun Kwak | 2019-03-19 |
| 10142079 | Method and apparatus for managing contention window in wireless communication system | Jin-Young Oh, Dong-Han Kim, Seung-Hoon Choi | 2018-11-27 |
| 9885953 | Method of manufacturing a mask | Jin-Seok Heo, Chang-Min Park, Seok-Hwan Oh | 2018-02-06 |
| 9632437 | Lithography apparatus, method for lithography and stage system | Jin Hong Park, Joo-On Park, Chang-Min Park | 2017-04-25 |
| 9256124 | Apparatus for manufacturing a mask | Jin-Seok Heo, Chang-Min Park, Seok-Hwan Oh | 2016-02-09 |
| 9078246 | Scheduling method in multiple access system and apparatus using the same | Ki Jun Kim, Min Uk Kim, Young-yun Kang, Yeo-Hun Yun, Joon Ho Cho | 2015-07-07 |
| 9065552 | Method and apparatus of transmitting data based on frequency hopping | Ki Jun Kim, Joon Ho Cho, Yeo-Hun Yun, Min Uk Kim, Eun A. Lee +1 more | 2015-06-23 |
| 9057954 | Apparatus for creating an extreme ultraviolet light, an exposing apparatus including the same, and electronic devices manufactured using the exposing apparatus | Chang-Min Park, Joo-On Park | 2015-06-16 |
| 9026054 | Method and apparatus for detecting radio signal | Ki Jun Kim, Joon Ho Cho | 2015-05-05 |
| 8930011 | Method of measuring an overlay of an object | Jin-Seok Heo, Seok-Hwan Oh | 2015-01-06 |
| 8912103 | Method of fabricating and correcting nanoimprint lithography templates | Jin-Seok Heo | 2014-12-16 |
| 8860953 | Method and apparatus for measuring overlay | Seong Bo Shim, Ho Yeon Kim | 2014-10-14 |
| 8625110 | Methods of inspecting structures | Seouk-Hoon Woo, Byeong-Ok Cho, Joo-On Park, Chang-Min Park, Won-sun Kim | 2014-01-07 |
| 8599360 | Reflective reticle chuck, reflective illumination system including the same, method of controlling flatness of reflective reticle using the chuck, and method of manufacturing semiconductor device using the chuck | Jin-Seok Heo, Chang-Min Park, Joo-On Park, In-Sung Kim | 2013-12-03 |
| 8492058 | Photolithography method including technique of determining distribution of energy of exposure light passing through slit of exposure apparatus | Jin-Seok Heo, Seok-Hwan Oh | 2013-07-23 |
| 8494095 | Method and apparatus for detecting presence of signal in wireless communication system based on CR technology | Joon Ho Cho | 2013-07-23 |
| 8384876 | Method of detecting reticle errors | Jin-Seok Heo, Jin Hong Park, Dae-Youp Lee | 2013-02-26 |
| 8341561 | Methods of arranging mask patterns and associated apparatus | Dong Woon PARK, Woo-Sung Han, Seong-woon Choi | 2012-12-25 |
| 8338063 | Photolithography method including technique of determining distribution of energy of exposure light passing through slit of exposure apparatus | Jin-Seok Heo, Seok-Hwan Oh | 2012-12-25 |
| 8287792 | Methods of forming fine patterns using a nanoimprint lithography | Jeong Hoon Lee, Joo-On Park, In-Sung Kim, Doo-Hoon Goo, Jin Hong Park +1 more | 2012-10-16 |
| 7990546 | High throughput across-wafer-variation mapping | Efrat Rosenman, Erez Ravid, Doron Meshulach, Gadi Greenberg, Kobi Kan +2 more | 2011-08-02 |