Issued Patents All Time
Showing 1–22 of 22 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11456264 | Method of manufacturing semiconductor device | Yoshiaki Sato, Mitsunobu WANSAWA, Akira Matsumoto, Kentaro Saito | 2022-09-27 |
| 11387172 | Semiconductor device and method for manufacturing the same | Iwao Natori, Seiya Isozaki | 2022-07-12 |
| 10818601 | Semiconductor device and method of manufacturing the same | Akinobu Watanabe | 2020-10-27 |
| 10777507 | Semiconductor device including a pad and a wiring line arranged for bringing a probe into contact with the pad and method of manufacturing the same | Akinobu Watanabe | 2020-09-15 |
| 10141295 | Method for manufacturing semiconductor device | Bunji Yasumura, Fumikazu Takei, Akio Hasebe, Naohiro Makihira, Mitsuyuki Kubo | 2018-11-27 |
| 9825017 | Method for manufacturing semiconductor device | Bunji Yasumura, Fumikazu Takei, Akio Hasebe, Naohiro Makihira, Mitsuyuki Kubo | 2017-11-21 |
| 9490218 | Method for manufacturing semiconductor device | Bunji Yasumura, Fumikazu Takei, Akio Hasebe, Naohiro Makihira, Mitsuyuki Kubo | 2016-11-08 |
| 9230938 | Method of manufacturing semiconductor device | Akio Hasebe, Naohiro Makihira, Bunji Yasumura, Mitsuyuki Kubo, Fumikazu Takei | 2016-01-05 |
| 9171767 | Semiconductor device and manufacturing method for the same | Ryo Mori, Kazuki Fukuoka, Naozumi Morino | 2015-10-27 |
| 9053954 | Method for manufacturing semiconductor device | Bunji Yasumura, Fumikazu Takei, Akio Hasebe, Naohiro Makihira, Mitsuyuki Kubo | 2015-06-09 |
| 8945953 | Method of manufacturing semiconductor device | Akio Hasebe, Naohiro Makihira, Bunji Yasumura, Mitsuyuki Kubo, Fumikazu Takei | 2015-02-03 |
| 8896129 | Semiconductor device and manufacturing method for the same | Ryo Mori, Kazuki Fukuoka, Naozumi Morino | 2014-11-25 |
| 8178981 | Semiconductor device | Teruaki Kanzaki, Kazunobu Miki | 2012-05-15 |
| 7701063 | Semiconductor device | Teruaki Kanzaki, Kazunobu Miki | 2010-04-20 |
| 7534629 | Manufacturing method of semiconductor integrated circuit device | Teruo Shoji, Akio Hasebe, Motoji Murakami, Masayoshi Okamoto, Yasunori Narizuka +1 more | 2009-05-19 |
| 7423439 | Probe sheet adhesion holder, probe card, semiconductor test device, and manufacturing method of semiconductor device | Susumu Kasukabe, Teruo Shoji, Akio Hasebe, Yasunori Narizuka | 2008-09-09 |
| 7276923 | Semiconductor device test probe | Megumi Takemoto, Shigeki Maekawa, Yoshihiro Kashiba, Kazunobu Miki | 2007-10-02 |
| 7274195 | Semiconductor device test probe | Megumi Takemoto, Shigeki Maekawa, Yoshihiro Kashiba, Kazunobu Miki | 2007-09-25 |
| 6727714 | Probe card | — | 2004-04-27 |
| 6633176 | Semiconductor device test probe having improved tip portion and manufacturing method thereof | Megumi Takemoto, Shigeki Maekawa, Yoshihiro Kashiba, Kazunobu Miki | 2003-10-14 |
| 6628127 | Probe card for testing semiconductor integrated circuit and method of manufacturing the same | Megumi Takemoto, Shigeki Maekawa, Yoshihiro Kashiba, Masahiro Tanaka | 2003-09-30 |
| 6356096 | Test board for testing a semiconductor device utilizing first and second delay elements in a signal-transmission-path | Ryoichi Takagi, Masahiro Ueda | 2002-03-12 |