Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7080302 | Semiconductor device and test system therefor | — | 2006-07-18 |
| 6704897 | Semiconductor device and the test system for the same | — | 2004-03-09 |
| 6486690 | Device under test board and testing method | Masahiko Hyozo | 2002-11-26 |
| 6356096 | Test board for testing a semiconductor device utilizing first and second delay elements in a signal-transmission-path | Masahiro Ueda, Yoshinori Deguchi | 2002-03-12 |
| 6282680 | Semiconductor device | Katsushi Asahina | 2001-08-28 |
| 6150831 | Test method and device for semiconductor circuit | Mikio Asai | 2000-11-21 |
| 5969533 | Probe card and LSI test method using probe card | — | 1999-10-19 |
| 5844263 | Semiconductor integrated device having independent circuit blocks and a power breaking means for selectively supplying power to the circuit blocks | Mikio Asai, Masahiko Hyozo | 1998-12-01 |
| 5436559 | Method for testing semiconductor device | Tetsuo Tada, Koji Tanaka | 1995-07-25 |
| 5266894 | Apparatus and method for testing semiconductor device | Tetsuo Tada, Koji Tanaka | 1993-11-30 |
| 4961052 | Probing plate for wafer testing | Tetsuo Tada, Masanobu Kohara | 1990-10-02 |