Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5894172 | Semiconductor device with identification function | Masahiko Hyozo, Toshiyuki Tsujii, Hiroshi Noda, Ryouichi Takagi, Mikio Asai | 1999-04-13 |
| 5436559 | Method for testing semiconductor device | Ryoichi Takagi, Koji Tanaka | 1995-07-25 |
| 5266894 | Apparatus and method for testing semiconductor device | Ryoichi Takagi, Koji Tanaka | 1993-11-30 |
| 5055780 | Probe plate used for testing a semiconductor device, and a test apparatus therefor | Ryouichi Takagi, Masanobu Kohara | 1991-10-08 |
| 5042148 | Method of manufacturing a probing card for wafer testing | Ryouichi Takagi | 1991-08-27 |
| 4983908 | Probing card for wafer testing and method of manufacturing the same | Ryouichi Takagi | 1991-01-08 |
| 4961052 | Probing plate for wafer testing | Ryoichi Takagi, Masanobu Kohara | 1990-10-02 |
| 4888715 | Semiconductor test system | Hideo Matsui | 1989-12-19 |
| 4873686 | Test assist circuit for a semiconductor device providing fault isolation | Tsuyoshi Yamada | 1989-10-10 |
| 4813043 | Semiconductor test device | Hideshi Maeno | 1989-03-14 |
| 4807229 | Semiconductor device tester | — | 1989-02-21 |
| 4801871 | Testing apparatus for semiconductor device | Hideshi Maeno | 1989-01-31 |
| 4799009 | Semiconductor testing device | Keisuke Okada | 1989-01-17 |
| 4720671 | Semiconductor device testing device | Keiichi Sawada | 1988-01-19 |