Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6150727 | Semiconductor device | — | 2000-11-21 |
| 5894172 | Semiconductor device with identification function | Masahiko Hyozo, Toshiyuki Tsujii, Tetsuo Tada, Hiroshi Noda, Mikio Asai | 1999-04-13 |
| 5055780 | Probe plate used for testing a semiconductor device, and a test apparatus therefor | Tetsuo Tada, Masanobu Kohara | 1991-10-08 |
| 5042148 | Method of manufacturing a probing card for wafer testing | Tetsuo Tada | 1991-08-27 |
| 4983908 | Probing card for wafer testing and method of manufacturing the same | Tetsuo Tada | 1991-01-08 |