Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6519728 | Semiconductor integrated circuit having test circuit | Masahiko Hyozo | 2003-02-11 |
| 6489791 | Build off self-test (Bost) testing method | — | 2002-12-03 |
| 6486691 | Tester for a semiconductor IC circuit having multiple pins | — | 2002-11-26 |
| 6393593 | Tester and method for testing LSI designed for scan method | — | 2002-05-21 |
| 6351836 | Semiconductor device with boundary scanning circuit | — | 2002-02-26 |
| 6300577 | Film carrier and method of burn-in testing | — | 2001-10-09 |
| 6006350 | Semiconductor device testing apparatus and method for testing memory and logic sections of a semiconductor device | — | 1999-12-21 |
| 5894172 | Semiconductor device with identification function | Masahiko Hyozo, Tetsuo Tada, Hiroshi Noda, Ryouichi Takagi, Mikio Asai | 1999-04-13 |