Issued Patents All Time
Showing 1–25 of 43 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10777293 | Semiconductor device, memory test method for semiconductor device, and test pattern generation program | Tomonori Sasaki, Tatsuya Saito, Takeshi Ueki | 2020-09-15 |
| 10580513 | Semiconductor device and diagnostic method therefor | Yoichi Maeda, Jun Matsushima | 2020-03-03 |
| 10504609 | Semiconductor device and diagnosis method thereof | Yoichi Maeda, Jun Matsushima | 2019-12-10 |
| 7441169 | Semiconductor integrated circuit with test circuit | — | 2008-10-21 |
| 7149942 | Semiconductor integrated circuit with test circuit | — | 2006-12-12 |
| 6964000 | Semiconductor integrated circuit device having a test circuit of a random access memory | — | 2005-11-08 |
| 6678846 | Semiconductor integrated circuit with a scan path circuit | — | 2004-01-13 |
| 6571364 | Semiconductor integrated circuit device with fault analysis function | Tokuya Osawa | 2003-05-27 |
| 6516431 | Semiconductor device | — | 2003-02-04 |
| 6504772 | Testing method and test apparatus in semiconductor apparatus | — | 2003-01-07 |
| 6420896 | Semiconductor integrated circuit | — | 2002-07-16 |
| 6401226 | Electronic system with self-test function and simulation circuit for electronic system | — | 2002-06-04 |
| 6400292 | Semiconductor integrated circuit device | — | 2002-06-04 |
| 6397363 | Semiconductor integrated circuit device with test circuit | Tokuya Osawa | 2002-05-28 |
| 6286121 | Semiconductor device | Tokuya Osawa | 2001-09-04 |
| 6275963 | Test circuit and a redundancy circuit for an internal memory circuit | Tokuya Osawa | 2001-08-14 |
| 6229741 | Semiconductor integrated circuit device | — | 2001-05-08 |
| 5960008 | Test circuit | Tokuya Osawa | 1999-09-28 |
| 5946247 | Semiconductor memory testing device | Tokuya Osawa | 1999-08-31 |
| 5905737 | Test circuit | Tokuya Osawa | 1999-05-18 |
| 5903579 | Scan path forming circuit | Tokuya Osawa | 1999-05-11 |
| 5848074 | Method and device for testing content addressable memory circuit and content addressable memory circuit with redundancy function | — | 1998-12-08 |
| 5841690 | Semiconductor memory | Koji Shibutani | 1998-11-24 |
| 5829015 | Semiconductor integrated circuit device having multi-port RAM memory with random logic portion which can be tested without additional test circuitry | — | 1998-10-27 |
| 5818776 | Semiconductor memory device and method of reading data therefrom | Koji Shibutani | 1998-10-06 |