Issued Patents All Time
Showing 26–43 of 43 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5815512 | Semiconductor memory testing device | Tokuya Osawa | 1998-09-29 |
| 5787033 | Semiconductor memory device with reduced probability of power consumption | — | 1998-07-28 |
| 5784384 | Flip-flop circuit, scan path and storage circuit | — | 1998-07-21 |
| 5771194 | Memory circuit, data control circuit of memory circuit and address assigning circuit of memory circuit | — | 1998-06-23 |
| 5742540 | Semiconductor memory and layout/circuit information generating apparatus | Hirohiko Wakasugi | 1998-04-21 |
| 5724367 | Semiconductor memory device having scan path for testing | Tokuya Osawa | 1998-03-03 |
| 5719819 | Semiconductor storage circuit device operating in a plurality of operation modes and corresponding device for designing a semiconductor storage circuit device | — | 1998-02-17 |
| 5719913 | Pseudo-random number generating circuit and bidirectional shift register | — | 1998-02-17 |
| RE35591 | Memory cell array semiconductor integrated circuit device | Koji Nii | 1997-08-19 |
| 5654914 | Memory cell array semiconductor integrated circuit device | Koji Nii | 1997-08-05 |
| 5592424 | Semiconductor integrated circuit device | — | 1997-01-07 |
| 5471420 | Memory cell array semiconductor integrated circuit device | Koji Nii | 1995-11-28 |
| 5197070 | Scan register and testing circuit using the same | — | 1993-03-23 |
| 4969126 | Semiconductor memory device having serial addressing and operating method thereof | — | 1990-11-06 |
| 4926424 | Test auxiliary circuit for testing semiconductor device | — | 1990-05-15 |
| 4914379 | Semiconductor integrated circuit and method of testing same | — | 1990-04-03 |
| 4813043 | Semiconductor test device | Tetsuo Tada | 1989-03-14 |
| 4801871 | Testing apparatus for semiconductor device | Tetsuo Tada | 1989-01-31 |