Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8178981 | Semiconductor device | Teruaki Kanzaki, Yoshinori Deguchi | 2012-05-15 |
| 8084279 | Method of manufacturing semiconductor device that uses both a normal photomask and a phase shift mask for defining interconnect patterns | Tatsuo Kasaoka, Kiyohiko Sakakibara, Noboru Mori | 2011-12-27 |
| 7956473 | Semiconductor device | Hiroyuki Momono, Hiroshi Mitsuyama, Katsuhiro Hasegawa, Keiko Nishitsuji | 2011-06-07 |
| 7701063 | Semiconductor device | Teruaki Kanzaki, Yoshinori Deguchi | 2010-04-20 |
| 7696081 | Method of manufacturing semiconductor device that uses both a normal photomask and a phase shift mask for defining interconnect patterns | Tatsuo Kasaoka, Kiyohiko Sakakibara, Noboru Mori | 2010-04-13 |
| 7276923 | Semiconductor device test probe | Megumi Takemoto, Shigeki Maekawa, Yoshihiro Kashiba, Yoshinori Deguchi | 2007-10-02 |
| 7274195 | Semiconductor device test probe | Megumi Takemoto, Shigeki Maekawa, Yoshihiro Kashiba, Yoshinori Deguchi | 2007-09-25 |
| 6888344 | Test probe for semiconductor devices, method of manufacturing of the same, and member for removing foreign matter | Shigeki Maekawa, Megumi Takemoto, Mutsumi Kano, Takahiro Nagata, Yoshihiro Kashiba | 2005-05-03 |
| 6710615 | Semiconductor element test apparatus, and method of testing semiconductor element using the apparatus | — | 2004-03-23 |
| 6646455 | Test probe for semiconductor devices, method of manufacturing of the same, and member for removing foreign matter | Shigeki Maekawa, Megumi Takemoto, Mutsumi Kano, Takahiro Nagata, Yoshihiro Kashiba | 2003-11-11 |
| 6633176 | Semiconductor device test probe having improved tip portion and manufacturing method thereof | Megumi Takemoto, Shigeki Maekawa, Yoshihiro Kashiba, Yoshinori Deguchi | 2003-10-14 |
| 6339257 | Semiconductor device | Noriaki Fujiki, Takashi Yamashita, Shigeru Harada | 2002-01-15 |