Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7785406 | Apparatus for volatile organic compound treatment and method of volatile organic compound treatment | Kouji Ota, Yasutaka Inanaga, Yasuhiro Tanimura, Masaki Kuzumoto, Hajime Nakatani +3 more | 2010-08-31 |
| 7534979 | Pressure-contact type rectifier with contact friction reducer | Shinichi Ito, Hiroya Ikuta, Shigeharu Nagai, Toshiaki Kashihara, Shinji Iwamoto +1 more | 2009-05-19 |
| 7276923 | Semiconductor device test probe | Megumi Takemoto, Yoshihiro Kashiba, Yoshinori Deguchi, Kazunobu Miki | 2007-10-02 |
| 7274195 | Semiconductor device test probe | Megumi Takemoto, Yoshihiro Kashiba, Yoshinori Deguchi, Kazunobu Miki | 2007-09-25 |
| 7112976 | Test socket, method of manufacturing the test socket, test method using the test socket, and member to be tested | Yasushi Tokumo, Yoshihiro Kashiba, Shigeru Takada | 2006-09-26 |
| 6989681 | Socket for testing a semiconductor device and a connecting sheet used for the same | Yoshihiro Kashiba | 2006-01-24 |
| 6888344 | Test probe for semiconductor devices, method of manufacturing of the same, and member for removing foreign matter | Megumi Takemoto, Kazunobu Miki, Mutsumi Kano, Takahiro Nagata, Yoshihiro Kashiba | 2005-05-03 |
| 6885204 | Probe card, and testing apparatus having the same | Megumi Takemoto, Yoshihiro Kashiba, Yuetsu Watanabe | 2005-04-26 |
| 6882069 | Vehicle AC generator with rectifier diode package disposed between cooling plates | Toshiaki Kashihara, Yoshihiro Kashiba | 2005-04-19 |
| 6794890 | Test socket, method of manufacturing the test socket, test method using the test socket, and member to be tested | Yasushi Tokumo, Yoshihiro Kashiba, Shigeru Takada | 2004-09-21 |
| 6741086 | Member for removing foreign matter adhering to probe tip and method of manufacturing the probe tip, method of cleaning foreign matter adhering to probe tip, probe, and probing apparatus | Megumi Takemoto, Yoshihiro Kashiba | 2004-05-25 |
| 6667626 | Probe card, and testing apparatus having the same | Megumi Takemoto, Yoshihiro Kashiba, Yuetsu Watanabe | 2003-12-23 |
| 6646455 | Test probe for semiconductor devices, method of manufacturing of the same, and member for removing foreign matter | Megumi Takemoto, Kazunobu Miki, Mutsumi Kano, Takahiro Nagata, Yoshihiro Kashiba | 2003-11-11 |
| 6633176 | Semiconductor device test probe having improved tip portion and manufacturing method thereof | Megumi Takemoto, Yoshihiro Kashiba, Yoshinori Deguchi, Kazunobu Miki | 2003-10-14 |
| 6628127 | Probe card for testing semiconductor integrated circuit and method of manufacturing the same | Megumi Takemoto, Yoshihiro Kashiba, Yoshinori Deguchi, Masahiro Tanaka | 2003-09-30 |
| 6344753 | Test socket having improved contact terminals, and method of forming contact terminals of the test socket | Shigeru Takada, Yasushi Tokumo, Keiko Kaneko | 2002-02-05 |
| 5972069 | Metallic material made from tungsten or molybdenum, method of producing the metallic material, and secondary product material using the metallic material | Megumi Takemoto | 1999-10-26 |
| 5672285 | Laser casting apparatus and method | Masaki Kondo | 1997-09-30 |
| 5433262 | Method for manufacturing casting and apparatus for manufacturing a casting | Kenji Kawaguchi, Mikio Yamashita | 1995-07-18 |
| 5067550 | Manufacturing method for defect-free casting product | Mikio Yamashita, Kenji Kawaguchi, Yuji Kobayashi | 1991-11-26 |