Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7825677 | Test jig for testing a packaged high frequency semiconductor device | Tomoyuki Kamiyama | 2010-11-02 |
| 7276923 | Semiconductor device test probe | Shigeki Maekawa, Yoshihiro Kashiba, Yoshinori Deguchi, Kazunobu Miki | 2007-10-02 |
| 7274195 | Semiconductor device test probe | Shigeki Maekawa, Yoshihiro Kashiba, Yoshinori Deguchi, Kazunobu Miki | 2007-09-25 |
| 6888344 | Test probe for semiconductor devices, method of manufacturing of the same, and member for removing foreign matter | Shigeki Maekawa, Kazunobu Miki, Mutsumi Kano, Takahiro Nagata, Yoshihiro Kashiba | 2005-05-03 |
| 6885204 | Probe card, and testing apparatus having the same | Shigeki Maekawa, Yoshihiro Kashiba, Yuetsu Watanabe | 2005-04-26 |
| 6741086 | Member for removing foreign matter adhering to probe tip and method of manufacturing the probe tip, method of cleaning foreign matter adhering to probe tip, probe, and probing apparatus | Shigeki Maekawa, Yoshihiro Kashiba | 2004-05-25 |
| 6667626 | Probe card, and testing apparatus having the same | Shigeki Maekawa, Yoshihiro Kashiba, Yuetsu Watanabe | 2003-12-23 |
| 6646455 | Test probe for semiconductor devices, method of manufacturing of the same, and member for removing foreign matter | Shigeki Maekawa, Kazunobu Miki, Mutsumi Kano, Takahiro Nagata, Yoshihiro Kashiba | 2003-11-11 |
| 6633176 | Semiconductor device test probe having improved tip portion and manufacturing method thereof | Shigeki Maekawa, Yoshihiro Kashiba, Yoshinori Deguchi, Kazunobu Miki | 2003-10-14 |
| 6628127 | Probe card for testing semiconductor integrated circuit and method of manufacturing the same | Shigeki Maekawa, Yoshihiro Kashiba, Yoshinori Deguchi, Masahiro Tanaka | 2003-09-30 |
| 5972069 | Metallic material made from tungsten or molybdenum, method of producing the metallic material, and secondary product material using the metallic material | Shigeki Maekawa | 1999-10-26 |