Issued Patents All Time
Showing 101–125 of 132 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8901951 | High density test structure array to support addressable high accuracy 4-terminal measurements | Michele Squicciarini | 2014-12-02 |
| 8571535 | Method and system for a hosted mobile management service architecture | Daniel Lin | 2013-10-29 |
| 8484089 | Method and system for a hosted digital music library sharing service | Daniel Lin, Eric F. Allen | 2013-07-09 |
| 8417772 | Method and system for transferring content from the web to mobile devices | Daniel Lin | 2013-04-09 |
| 8362480 | Reusable test chip for inline probing of three dimensionally arranged experiments | John Kibarian, Amit Joag, Abdul Mobeen Mohammed, Ben Shieh, David Stashower | 2013-01-29 |
| 8178876 | Method and configuration for connecting test structures or line arrays for monitoring integrated circuit manufacturing | David Goldman | 2012-05-15 |
| 8086226 | Method and system for a hosted mobile management service architecture | Daniel Lin | 2011-12-27 |
| 8024400 | Method and system for transferring content from the web to mobile devices | Daniel Lin | 2011-09-20 |
| 7920856 | Method and system for hosted mobile management service architecture | Daniel Lin | 2011-04-05 |
| 7902852 | High density test structure array to support addressable high accuracy 4-terminal measurements | Michele Squicciarini | 2011-03-08 |
| 7783645 | Methods and apparatus to recall context relevant information | Michael Wynblatt, Mark H. Sher | 2010-08-24 |
| 7751807 | Method and system for a hosted mobile management service architecture | Daniel Lin | 2010-07-06 |
| 7716281 | Method and system for transferring content from the web to mobile devices | Daniel Lin | 2010-05-11 |
| 7673262 | System and method for product yield prediction | Brian E. Stine, John Kibarian, Kimon Michaels, Joseph C. Davis, Purnendu K. Mozumder +4 more | 2010-03-02 |
| 7527987 | Fast localization of electrical failures on an integrated circuit system and method | Dennis Ciplickas, Sherry Lee, Larg Weiland | 2009-05-05 |
| 7509320 | Methods and apparatus to determine context relevant information | Michael Wynblatt | 2009-03-24 |
| 7489151 | Layout for DUT arrays used in semiconductor wafer testing | Angelo Rossoni, Stefano Tonello, Michele Squicciarini, Michele Quarantelli | 2009-02-10 |
| 7487474 | Designing an integrated circuit to improve yield using a variant design element | Dennis Ciplickas, Joe Davis, Sherry Lee, Enrico Malavasi, Abdulmobeen Mohammad +9 more | 2009-02-03 |
| 7461043 | Methods and apparatus to abstract events in software applications or services | — | 2008-12-02 |
| 7451162 | Methods and apparatus to determine a software application data file and usage | — | 2008-11-11 |
| 7434197 | Method for improving mask layout and fabrication | Christoph Dolainsky, Jonathan O. Burrows, Dennis Ciplickas, Joseph C. Davis, Rakesh Vallishayee +2 more | 2008-10-07 |
| 7395518 | Back end of line clone test vehicle | Dennis Ciplickas | 2008-07-01 |
| 7373625 | System and method for product yield prediction | Brian E. Stine, John Kibarian, Kimon Michaels, Joseph C. Davis, Purnendu K. Mozumder +4 more | 2008-05-13 |
| 7356800 | System and method for product yield prediction | Brian E. Stine, John Kibarian, Kimon Michaels, Joseph C. Davis, Purnendu K. Mozumder +4 more | 2008-04-08 |
| 7197726 | Test structures for estimating dishing and erosion effects in copper damascene technology | Dennis Ciplickas, Markus Decker, Brian E. Stine, Larg Weiland | 2007-03-27 |