Issued Patents All Time
Showing 126–132 of 132 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7174521 | System and method for product yield prediction | Brian E. Stine, John Kibarian, Kimon Michaels, Joseph C. Davis, Purnendu K. Mozumder +4 more | 2007-02-06 |
| 7154115 | Zoom in pin nest structure, test vehicle having the structure, and method of fabricating the structure | Brian E. Stine, Larg Weiland, Dennis Ciplickas | 2006-12-26 |
| 7024642 | Extraction method of defect density and size distributions | David Stashower, Brian E. Stine, Larg Weiland, Richard Burch, Dennis Ciplickas | 2006-04-04 |
| 6901564 | System and method for product yield prediction | Brian E. Stine, John Kibarian, Kimon Michaels, Joseph C. Davis, Purnendu K. Mozumder +4 more | 2005-05-31 |
| 6834375 | System and method for product yield prediction using a logic characterization vehicle | Brian E. Stine, Larg Weiland, Dennis Ciplickas, John Kibarian | 2004-12-21 |
| 6787800 | Test vehicle with zig-zag structures | Larg Weiland | 2004-09-07 |
| 6475871 | Passive multiplexor test structure for integrated circuit manufacturing | Brian E. Stine, Larg Weiland | 2002-11-05 |