Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8362480 | Reusable test chip for inline probing of three dimensionally arranged experiments | Christopher Hess, John Kibarian, Amit Joag, Abdul Mobeen Mohammed, Ben Shieh | 2013-01-29 |
| 7673262 | System and method for product yield prediction | Brian E. Stine, Christopher Hess, John Kibarian, Kimon Michaels, Joseph C. Davis +4 more | 2010-03-02 |
| 7373625 | System and method for product yield prediction | Brian E. Stine, Christopher Hess, John Kibarian, Kimon Michaels, Joseph C. Davis +4 more | 2008-05-13 |
| 7356800 | System and method for product yield prediction | Brian E. Stine, Christopher Hess, John Kibarian, Kimon Michaels, Joseph C. Davis +4 more | 2008-04-08 |
| 7174521 | System and method for product yield prediction | Brian E. Stine, Christopher Hess, John Kibarian, Kimon Michaels, Joseph C. Davis +4 more | 2007-02-06 |
| 7024642 | Extraction method of defect density and size distributions | Christopher Hess, Brian E. Stine, Larg Weiland, Richard Burch, Dennis Ciplickas | 2006-04-04 |
| 6901564 | System and method for product yield prediction | Brian E. Stine, Christopher Hess, John Kibarian, Kimon Michaels, Joseph C. Davis +4 more | 2005-05-31 |
| 6795952 | System and method for product yield prediction using device and process neighborhood characterization vehicle | Brian E. Stine, Sherry Lee, Kurt H. Weiner | 2004-09-21 |