| 12038802 |
Collaborative learning model for semiconductor applications |
Tomonori Honda, Richard Burch, John Kibarian, Lin Lee Cheong, Qing Zhu +6 more |
2024-07-16 |
$4,924,000 |
| 10897814 |
Characterization vehicles for printed circuit board and system design |
— |
2021-01-19 |
$8,841,000 |
| 10656204 |
Failure detection for wire bonding in semiconductors |
Richard Burch, Nobuchika Akiya |
2020-05-19 |
$4,334,000 |
| 10517169 |
Characterization vehicles for printed circuit board and system design |
— |
2019-12-24 |
$3,859,000 |
| 10268562 |
Advanced manufacturing insight system for semiconductor application |
Richard Burch, Lijin Zhu |
2019-04-23 |
$2,173,000 |
| 7807480 |
Test cells for semiconductor yield improvement |
Victor Kitch, Mark Zwald, Stefano Tonello |
2010-10-05 |
$814,000 |
| 7673262 |
System and method for product yield prediction |
Christopher Hess, John Kibarian, Kimon Michaels, Joseph C. Davis, Purnendu K. Mozumder +4 more |
2010-03-02 |
$1,683,000 |
| 7494893 |
Identifying yield-relevant process parameters in integrated circuit device fabrication processes |
Anand Inani, Marci Liao, Senthil Arthanari, Michael Williamson, Spencer B. Graves +1 more |
2009-02-24 |
$564,000 |
| 7487474 |
Designing an integrated circuit to improve yield using a variant design element |
Dennis Ciplickas, Joe Davis, Christopher Hess, Sherry Lee, Enrico Malavasi +9 more |
2009-02-03 |
$830,000 |
| 7373625 |
System and method for product yield prediction |
Christopher Hess, John Kibarian, Kimon Michaels, Joseph C. Davis, Purnendu K. Mozumder +4 more |
2008-05-13 |
$2,340,000 |
| 7356800 |
System and method for product yield prediction |
Christopher Hess, John Kibarian, Kimon Michaels, Joseph C. Davis, Purnendu K. Mozumder +4 more |
2008-04-08 |
$2,438,000 |
| 7348594 |
Test structures and models for estimating the yield impact of dishing and/or voids |
Dennis Ciplickas, Yanwen Fei |
2008-03-25 |
$2,316,000 |
| 7305638 |
Method and system for ROM coding to improve yield |
— |
2007-12-04 |
$2,865,000 |
| 7197726 |
Test structures for estimating dishing and erosion effects in copper damascene technology |
Dennis Ciplickas, Markus Decker, Christopher Hess, Larg Weiland |
2007-03-27 |
$3,932,000 |
| 7174521 |
System and method for product yield prediction |
Christopher Hess, John Kibarian, Kimon Michaels, Joseph C. Davis, Purnendu K. Mozumder +4 more |
2007-02-06 |
$4,311,000 |
| 7154115 |
Zoom in pin nest structure, test vehicle having the structure, and method of fabricating the structure |
Christopher Hess, Larg Weiland, Dennis Ciplickas |
2006-12-26 |
$4,677,000 |
| 7024642 |
Extraction method of defect density and size distributions |
Christopher Hess, David Stashower, Larg Weiland, Richard Burch, Dennis Ciplickas |
2006-04-04 |
$4,568,000 |
| 6901564 |
System and method for product yield prediction |
Christopher Hess, John Kibarian, Kimon Michaels, Joseph C. Davis, Purnendu K. Mozumder +4 more |
2005-05-31 |
$3,486,000 |
| 6834375 |
System and method for product yield prediction using a logic characterization vehicle |
Christopher Hess, Larg Weiland, Dennis Ciplickas, John Kibarian |
2004-12-21 |
$4,777,000 |
| 6795952 |
System and method for product yield prediction using device and process neighborhood characterization vehicle |
David Stashower, Sherry Lee, Kurt H. Weiner |
2004-09-21 |
$4,121,000 |
| 6475871 |
Passive multiplexor test structure for integrated circuit manufacturing |
Christopher Hess, Larg Weiland |
2002-11-05 |
$3,352,000 |
| 6449749 |
System and method for product yield prediction |
— |
2002-09-10 |
$2,592,000 |