Issued Patents All Time
Showing 1–22 of 22 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12038802 | Collaborative learning model for semiconductor applications | Tomonori Honda, Richard Burch, John Kibarian, Lin Lee Cheong, Qing Zhu +6 more | 2024-07-16 |
| 10897814 | Characterization vehicles for printed circuit board and system design | — | 2021-01-19 |
| 10656204 | Failure detection for wire bonding in semiconductors | Richard Burch, Nobuchika Akiya | 2020-05-19 |
| 10517169 | Characterization vehicles for printed circuit board and system design | — | 2019-12-24 |
| 10268562 | Advanced manufacturing insight system for semiconductor application | Richard Burch, Lijin Zhu | 2019-04-23 |
| 7807480 | Test cells for semiconductor yield improvement | Victor Kitch, Mark Zwald, Stefano Tonello | 2010-10-05 |
| 7673262 | System and method for product yield prediction | Christopher Hess, John Kibarian, Kimon Michaels, Joseph C. Davis, Purnendu K. Mozumder +4 more | 2010-03-02 |
| 7494893 | Identifying yield-relevant process parameters in integrated circuit device fabrication processes | Anand Inani, Marci Liao, Senthil Arthanari, Michael Williamson, Spencer B. Graves +1 more | 2009-02-24 |
| 7487474 | Designing an integrated circuit to improve yield using a variant design element | Dennis Ciplickas, Joe Davis, Christopher Hess, Sherry Lee, Enrico Malavasi +9 more | 2009-02-03 |
| 7373625 | System and method for product yield prediction | Christopher Hess, John Kibarian, Kimon Michaels, Joseph C. Davis, Purnendu K. Mozumder +4 more | 2008-05-13 |
| 7356800 | System and method for product yield prediction | Christopher Hess, John Kibarian, Kimon Michaels, Joseph C. Davis, Purnendu K. Mozumder +4 more | 2008-04-08 |
| 7348594 | Test structures and models for estimating the yield impact of dishing and/or voids | Dennis Ciplickas, Yanwen Fei | 2008-03-25 |
| 7305638 | Method and system for ROM coding to improve yield | — | 2007-12-04 |
| 7197726 | Test structures for estimating dishing and erosion effects in copper damascene technology | Dennis Ciplickas, Markus Decker, Christopher Hess, Larg Weiland | 2007-03-27 |
| 7174521 | System and method for product yield prediction | Christopher Hess, John Kibarian, Kimon Michaels, Joseph C. Davis, Purnendu K. Mozumder +4 more | 2007-02-06 |
| 7154115 | Zoom in pin nest structure, test vehicle having the structure, and method of fabricating the structure | Christopher Hess, Larg Weiland, Dennis Ciplickas | 2006-12-26 |
| 7024642 | Extraction method of defect density and size distributions | Christopher Hess, David Stashower, Larg Weiland, Richard Burch, Dennis Ciplickas | 2006-04-04 |
| 6901564 | System and method for product yield prediction | Christopher Hess, John Kibarian, Kimon Michaels, Joseph C. Davis, Purnendu K. Mozumder +4 more | 2005-05-31 |
| 6834375 | System and method for product yield prediction using a logic characterization vehicle | Christopher Hess, Larg Weiland, Dennis Ciplickas, John Kibarian | 2004-12-21 |
| 6795952 | System and method for product yield prediction using device and process neighborhood characterization vehicle | David Stashower, Sherry Lee, Kurt H. Weiner | 2004-09-21 |
| 6475871 | Passive multiplexor test structure for integrated circuit manufacturing | Christopher Hess, Larg Weiland | 2002-11-05 |
| 6449749 | System and method for product yield prediction | — | 2002-09-10 |