Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method of forming a sample image and charged particle beam apparatus

Method of forming a sample image and charged particle beam apparatus

US Patent 7800059 · Granted Sep 21, 2010

Estimated economic value: $76,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Measurement system, method for generating learning model to be used when perform2025
Photo-alignment copolymer, photo-alignment film, and optical laminate2024
Photo-alignment polymer, binder composition, binder layer, optical laminate, opt2023
Electron beam observation device, electron beam observation system, and image co2023
Photo-alignment copolymer, binder composition, binder layer, optical laminate, a2023
Charged particle beam device2023
Charged particle beam device2023
Photo-alignable polymer, binder composition, binder layer, optical laminate, met2022
Pattern measurement device and non-transitory computer readable medium having st2021
Electron beam observation device, electron beam observation system, and control 2021
Electron beam device and image processing method2021
Charged particle beam device for imaging vias inside trenches2021