Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Automated selection of X-ray reflectometry measurement locations

Automated selection of X-ray reflectometry measurement locations

US Patent 7649978 · Granted Jan 19, 2010

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Small-angle X-ray scatterometry2024
Membrane based in-line fouling monitor for performance tracking in reverse osmos2024
Small-angle x-ray scatterometry2023
Systems and methods for controlling motion of detectors having moving detector h2023
Small-angle x-ray scatterometry2021
Method and apparatus for X-ray scatterometry2021
Methods and apparatus for imaging with detectors having moving detector heads2021
Energy efficient low-fouling high-recovery reverse osmosis system for brackish w2020
Method and apparatus for X-ray scatterometry2020
Integrated ultrafiltration and reverse osmosis desalination systems2020
Membranes with polydopamine coatings2019
Systems and methods for controlling motion of detectors having moving detector h2019