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Moshe Beylin

JS Jordan Valley Semiconductors: 1 patents #19 of 29Top 70%
Overall (All Time): #3,276,664 of 4,157,543Top 80%
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Patent #TitleCo-InventorsDate
7649978 Automated selection of X-ray reflectometry measurement locations Isaac Mazor, Alex Dikopoltsev, Boris Yokhin, Dileep Agnihotri, Tzachi Rafaeli +2 more 2010-01-19