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Home › Method and apparatus to calibrate DRAM on resistance (Ron) and on-die termination (ODT) values over process, voltage and temperature (PVT) variations

Method and apparatus to calibrate DRAM on resistance (Ron) and on-die termination (ODT) values over process, voltage and temperature (PVT) variations

US Patent 7432731 · Granted Oct 7, 2008

Estimated economic value: $21,141,000 ⓘ

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