Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Wafer inspection

Wafer inspection

US Patent 10488348 · Granted Nov 26, 2019

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Time delay integration acquisition for spatial genomics imaging2025
Subsurface alignment metrology system for packaging applications2025
Fiber bundle based optical spot size selector2025
Large-particle monitoring with laser power control for defect inspection2025
Large-particle monitoring with laser power control for defect inspection2025
Reflective waveplates for pupil polarization filtering2025
Image based metrology of surface deformations2025
Image based metrology of surface deformations2025
System and method to map thickness variations of substrates in manufacturing sys2025
Metrology system for packaging applications2025
In-line monitoring of OLED layer thickness and dopant concentration2025
Spatial pattern loading measurement with imaging metrology2025