Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12165863 | Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry | David A. Reed, Bruno W. Schueler, Bruce H. Newcome, Rodney Smedt | 2024-12-10 |
| 11764050 | Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry | David A. Reed, Bruno W. Schueler, Bruce H. Newcome, Rodney Smedt | 2023-09-19 |
| 11430647 | Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry | David A. Reed, Bruno W. Schueler, Bruce H. Newcome, Rodney Smedt | 2022-08-30 |
| 10910208 | Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry | David A. Reed, Bruno W. Schueler, Bruce H. Newcome, Rodney Smedt | 2021-02-02 |
| 10636644 | Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry | David A. Reed, Bruno W. Schueler, Bruce H. Newcome, Rodney Smedt | 2020-04-28 |
| 10403489 | Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry | David A. Reed, Bruno W. Schueler, Bruce H. Newcome, Rodney Smedt | 2019-09-03 |
| 10056242 | Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry | David A. Reed, Bruno W. Schueler, Bruce H. Newcome, Rodney Smedt | 2018-08-21 |
| 7098456 | Method and apparatus for accurate e-beam metrology | Gian Francesco Lorusso, Paola De Cecco, Luca Grella, David L. Adler, David Goodstein | 2006-08-29 |