Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
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Chris Bevis — 8 Patents

NINova Measuring Instruments: 7 patents #21 of 108Top 20%
Kla-Tencor: 1 patents #1,698 of 2,049Top 85%
Los Gatos, CA: #893 of 2,986 inventorsTop 30%
California: #74,834 of 386,348 inventorsTop 20%
Overall (All Time): #600,572 of 4,157,543Top 15%
8 Patents All Time
Chris Bevis has been granted 8 US patents while listed as an inventor at Nova Measuring Instruments. The first was granted in 2006 and the most recent in December 2024. Chris Bevis ranks #600,572 of 4,157,543 US inventors in our database (top 14.4%). Patent records list Chris Bevis in Los Gatos, CA, US.

Patents per Year

Patents granted per year, 2006 to 2024Bar chart with a peak of 1 patents in 2006.peak 12006: 1 patents20062018: 1 patents20182019: 1 patents20192020: 1 patents20202021: 1 patents20212022: 1 patents20222023: 1 patents20232024: 1 patents2024

Issued Patents All Time

Showing 1–8 of 8 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
12165863 Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry David A. Reed, Bruno W. Schueler, Bruce H. Newcome, Rodney Smedt 2024-12-10 $59,049,000
11764050 Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry David A. Reed, Bruno W. Schueler, Bruce H. Newcome, Rodney Smedt 2023-09-19 $20,904,000
11430647 Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry David A. Reed, Bruno W. Schueler, Bruce H. Newcome, Rodney Smedt 2022-08-30 $25,703,000
10910208 Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry David A. Reed, Bruno W. Schueler, Bruce H. Newcome, Rodney Smedt 2021-02-02 $15,872,000
10636644 Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry David A. Reed, Bruno W. Schueler, Bruce H. Newcome, Rodney Smedt 2020-04-28 $6,890,000
10403489 Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry David A. Reed, Bruno W. Schueler, Bruce H. Newcome, Rodney Smedt 2019-09-03 $5,351,000
10056242 Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry David A. Reed, Bruno W. Schueler, Bruce H. Newcome, Rodney Smedt 2018-08-21 $3,446,000
7098456 Method and apparatus for accurate e-beam metrology Gian Francesco Lorusso, Paola De Cecco, Luca Grella, David L. Adler, David Goodstein 2006-08-29 $14,069,000