Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12165863 | Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry | David A. Reed, Bruno W. Schueler, Rodney Smedt, Chris Bevis | 2024-12-10 |
| 11996259 | Patterned x-ray emitting target | David A. Reed, Bruno W. Schueler | 2024-05-28 |
| 11764050 | Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry | David A. Reed, Bruno W. Schueler, Rodney Smedt, Chris Bevis | 2023-09-19 |
| 11430647 | Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry | David A. Reed, Bruno W. Schueler, Rodney Smedt, Chris Bevis | 2022-08-30 |
| 10910208 | Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry | David A. Reed, Bruno W. Schueler, Rodney Smedt, Chris Bevis | 2021-02-02 |
| 10636644 | Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry | David A. Reed, Bruno W. Schueler, Rodney Smedt, Chris Bevis | 2020-04-28 |
| 10403489 | Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry | David A. Reed, Bruno W. Schueler, Rodney Smedt, Chris Bevis | 2019-09-03 |
| 10056242 | Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry | David A. Reed, Bruno W. Schueler, Rodney Smedt, Chris Bevis | 2018-08-21 |
| 8011830 | Method and system for calibrating an X-ray photoelectron spectroscopy measurement | Bruno W. Schueler, David A. Reed, Jeffrey Allen Moore | 2011-09-06 |
| 7359487 | Diamond anode | — | 2008-04-15 |
| 5103083 | Position sensitive detector and method using successive interdigitated electrodes with different patterns | David A. Reed | 1992-04-07 |
| 4490806 | High repetition rate transient recorder with automatic integration | Christie G. Enke, John F. Holland | 1984-12-25 |