Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7098456 | Method and apparatus for accurate e-beam metrology | Gian Francesco Lorusso, Paola De Cecco, Luca Grella, David L. Adler, Chris Bevis | 2006-08-29 |
| 6384408 | Calibration of a scanning electron microscope | Jason C. Yee, Laurence S. Hordon, Weidong Liu | 2002-05-07 |