Issued Patents All Time
Showing 26–50 of 100 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8521795 | Random number generating device | Akio Fukushima, Kay Yakushiji, Shinji Yuasa, Koji Ando | 2013-08-27 |
| 8502331 | Magnetoresistive effect element, magnetic memory | Eiji Kitagawa, Tadaomi Daibou, Yutaka Hashimoto, Masaru Tokou, Tadashi Kai +10 more | 2013-08-06 |
| 8208292 | Magnetoresistive element and magnetic memory | Tadashi Kai, Katsuya Nishiyama, Toshihiko Nagase, Masatoshi Yoshikawa, Eiji Kitagawa +10 more | 2012-06-26 |
| 8107281 | Magnetoresistive element and magnetic memory | Tadashi Kai, Katsuya Nishiyama, Toshihiko Nagase, Masatoshi Yoshikawa, Eiji Kitagawa +10 more | 2012-01-31 |
| 8013408 | Negative-resistance device with the use of magneto-resistive effect | Hiroki Maehara, Akio Fukushima, Shinji Yuasa, Yoshishige Suzuki, Yoshinori Nagamine | 2011-09-06 |
| 7952074 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Katsuhiro Kuroda +12 more | 2011-05-31 |
| 7599545 | Method and its apparatus for inspecting defects | Yukihiro Shibata, Shunji Maeda | 2009-10-06 |
| 7556869 | Electronic device and wiring with a current induced cooling effect, and an electronic device capable of converting a temperature difference into voltage | Akio Fukushima, Atsushi Yamamoto | 2009-07-07 |
| 7460220 | Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspected | Shunji Maeda, Yasuhiko Nakayama, Minoru Yoshida, Kenji Oka | 2008-12-02 |
| 7417444 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Katsuhiro Kuroda +12 more | 2008-08-26 |
| 7180584 | Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspected | Shunji Maeda, Yasuhiko Nakayama, Minoru Yoshida, Kenji Oka | 2007-02-20 |
| 7061600 | Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns on an object to be inspected | Shunji Maeda, Yasuhiko Nakayama, Minoru Yoshida, Kenji Oka | 2006-06-13 |
| 7026830 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Katsuhiro Kuroda +12 more | 2006-04-11 |
| 6941200 | Automated guided vehicle, operation control system and method for the same, and automotive vehicle | Osamu Sonoyama, Takahiro Yokomae, Yoichi Sugitomo, Masahide Yoshihara, Osamu Matsushima +2 more | 2005-09-06 |
| 6563682 | Magneto resistive element | Junichi Sugawara, Eiji Nakashio | 2003-05-13 |
| 6559663 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Katsuhiro Kuroda +12 more | 2003-05-06 |
| 6404498 | Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns on an object to be inspected | Shunji Maeda, Yasuhiko Nakayama, Minoru Yoshida, Kenji Oka | 2002-06-11 |
| 6329826 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Katsuhiro Kuroda +12 more | 2001-12-11 |
| 6317512 | Pattern checking method and checking apparatus | Shunji Maeda, Hiroshi Makihira, Takashi Hiroi | 2001-11-13 |
| 6263099 | Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspected | Shunji Maeda, Yasuhiko Nakayama, Minoru Yoshida, Kenji Oka | 2001-07-17 |
| 6223027 | Image data transmission system and method | Fumitaka Ono, Junichi Sadamatsu, Yoshihiro Ashizaki, Koji Kaneko, Akira Kotani +4 more | 2001-04-24 |
| 6172363 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Katsuhiro Kuroda +12 more | 2001-01-09 |
| 5893896 | Apparatus and method for stability controlling vehicular attitude using vehicular braking system | Masamichi Imamura, Shinji Katayose, Jun Kubo | 1999-04-13 |
| 5821611 | Semiconductor device and process and leadframe for making the same | Masao Yamamoto, Komei Sudo, Daisuke Kitawaki, Takayuki Hamasaki, Masayoshi Akiyama +6 more | 1998-10-13 |
| 5774222 | Manufacturing method of semiconductor substrative and method and apparatus for inspecting defects of patterns on an object to be inspected | Shunji Maeda, Yasuhiko Nakayama, Minoru Yoshida, Kenji Oka | 1998-06-30 |