SM

Seiro Murakami

NI Nikon: 11 patents #395 of 2,493Top 20%
NK Nippon Kogaku K.K.: 3 patents #114 of 382Top 30%
Overall (All Time): #327,252 of 4,157,543Top 8%
15
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
6894763 Exposure apparatus and methods utilizing plural mask and object stages movable in opposite directions, and methods of producing devices using the same Takaharu Miura, Akikazu Tanimoto, Yutaka Ichihara, Hideo Mizutani 2005-05-17
RE38320 Projection exposure apparatus wherein focusing of the apparatus is changed by controlling the temperature of a lens element of the projection optical system Kenji Nishi, Kazuo Ushida, Tohru Kiuchi, Yasuaki Tanaka 2003-11-18
6608681 Exposure method and apparatus Yasuaki Tanaka, Kenji Nishi 2003-08-19
RE38113 Method of driving mask stage and method of mask alignment Kenji Nishi 2003-05-06
6433872 Exposure method and apparatus Kenji Nishi, Yasuaki Tanaka 2002-08-13
5883704 Projection exposure apparatus wherein focusing of the apparatus is changed by controlling the temperature of a lens element of the projection optical system Kenji Nishi, Kazuo Ushida, Tohru Kiuchi, Yasuaki Tanaka 1999-03-16
5739899 Projection exposure apparatus correcting tilt of telecentricity Kenji Nishi, Hiroshi Chiba 1998-04-14
5693439 Exposure method and apparatus Yasuaki Tanaka, Kenji Nishi 1997-12-02
5464715 Method of driving mask stage and method of mask alignment Kenji Nishi 1995-11-07
5448332 Exposure method and apparatus Yasuyuki Sakakibara, Yasuaki Tanaka, Kenji Nishi 1995-09-05
4860374 Apparatus for detecting position of reference pattern Akikazu Tanimoto, Susumu Makinouchi, Hidemi Kawai, Masaichi Murakami 1989-08-22
4702606 Position detecting system Toshio Matsuura, Yuji Imai, Kazuya Ohta, Akikazu Tanimoto 1987-10-27
4677301 Alignment apparatus Akikazu Tanimoto, Toshio Matsuura, Makoto Uehara, Kyoichi Suwa 1987-06-30
4655598 Position detection method and apparatus Toshio Matsuura, Yuji Imai, Kazuya Ohta 1987-04-07
4639604 Method and apparatus for detecting an edge position of a pattern and eliminating overlapping pattern signals Muneki Hamajima 1987-01-27