MN

Mamoru Nakasuji

NI Nikon: 70 patents #18 of 2,493Top 1%
EB Ebara: 56 patents #16 of 1,611Top 1%
KT Kabushiki Kaisha Toshiba: 12 patents #2,533 of 21,451Top 15%
UN Unknown: 4 patents #4,220 of 83,584Top 6%
TO Toshiba: 2 patents #606 of 2,688Top 25%
VA Vlsi Technology Research Association: 2 patents #9 of 70Top 15%
TC Toshiba Machine Co.: 1 patents #70 of 186Top 40%
Overall (All Time): #8,059 of 4,157,543Top 1%
133
Patents All Time

Issued Patents All Time

Showing 101–125 of 133 patents

Patent #TitleCo-InventorsDate
5994708 Demagnifying charged-particle lithography apparatus 1999-11-30
5994704 Electromagnetic deflector 1999-11-30
5986765 Apparatus including compensation mask to correct particle beam proximity-effect 1999-11-16
5981947 Apparatus for detecting or collecting secondary electrons, charged-particle beam exposure apparatus comprising same, and related methods Teruaki Okino, Noriyuki Hirayanagi 1999-11-09
5977550 Charged-particle-beam optical systems 1999-11-02
5973333 Charged-particle-beam pattern-transfer apparatus and methods Teruaki Okino 1999-10-26
5958626 Mask used in charged particle beam projecting apparatus and method for dividing pattern 1999-09-28
5952133 Methods for evaluating image-forming characteristics of a projection-optical system used in a charged-particle-beam microlithography apparatus 1999-09-14
5933217 Electron-beam projection-microlithography apparatus and methods Teruaki Okino 1999-08-03
5895925 Mask used in charged particle beam projecting apparatus and method for dividing pattern 1999-04-20
5894132 Charged-particle-beam projection-exposure apparatus with focus and tilt adjustments Shohei Suzuki 1999-04-13
5892224 Apparatus and methods for inspecting wafers and masks using multiple charged-particle beams 1999-04-06
5888682 Method of using a compensation mask to correct particle beam proximity-effect 1999-03-30
5847402 Charged particle beam pattern transfer apparatus and method 1998-12-08
5831274 Apparatus for image transfer with charged particle beam, and deflector and mask used with such apparatus 1998-11-03
5831270 Magnetic deflectors and charged-particle-beam lithography systems incorporating same 1998-11-03
5798194 Masks for charged-particle beam microlithography Shintaro Kawata 1998-08-25
5773837 Apparatus for image transfer with charged particle beam, and deflector and mask used with such apparatus 1998-06-30
5773838 Apparatus for image transfer with charged particle beam, and deflector and mask used with such apparatus 1998-06-30
5770863 Charged particle beam projection apparatus 1998-06-23
5763893 Electron gun and electron-beam transfer apparatus comprising same 1998-06-09
5753922 Electromagnetic deflector 1998-05-19
5751538 Mask holding device and method for holding mask 1998-05-12
5747819 Charged particle beam transfer device exhibiting low aberration Hiroyasu Simizu 1998-05-05
5689117 Apparatus for image transfer with charged particle beam, and deflector and mask used with such apparatus 1997-11-18