SC

Srimat Chakradhar

NE Nec: 81 patents #50 of 14,502Top 1%
NA Nec Laboratories America: 47 patents #6 of 412Top 2%
AT AT&T: 2 patents #7,280 of 18,772Top 40%
NE Nec Electronics: 1 patents #715 of 1,789Top 40%
Lsi Logic: 1 patents #1,146 of 1,957Top 60%
NI Nec Research Institute: 1 patents #57 of 127Top 45%
RU Rutgers University: 1 patents #54 of 194Top 30%
University of California: 1 patents #8,022 of 18,278Top 45%
📍 Manalapan, NJ: #3 of 380 inventorsTop 1%
🗺 New Jersey: #122 of 69,400 inventorsTop 1%
Overall (All Time): #8,483 of 4,157,543Top 1%
129
Patents All Time

Issued Patents All Time

Showing 76–100 of 129 patents

Patent #TitleCo-InventorsDate
8225074 Methods and systems for managing computations on a hybrid computing platform including a parallel accelerator Anand Raghunathan, Narayanan Sundaram 2012-07-17
7921206 Visibility and control of wireless sensor networks Kiran Nagaraja, Vijay Raghunathan, Florin Sultan, Nupur Kothari 2011-04-05
7818643 Method for blocking unknown values in output response of scan test patterns for testing circuits Seongmoon Wang 2010-10-19
7784046 Automatically boosting the software content of system LSI designs Marcello Lajolo, Kanishka Lahiri, Abhishek MITRA 2010-08-24
7653670 Storage-efficient and collision-free hash-based packet processing architecture and method Jahangir Hasan, Srihari Cadambi 2010-01-26
7610527 Test output compaction with improved blocking of unknown values Seongmoon Wang, Kedarnath Balakrishnan 2009-10-27
7610540 Method for generating, from a test cube set, a generator configured to generate a test pattern Kedarnath Balakrishnan, Seongmoon Wang, Wenlong Wei 2009-10-27
7610539 Method and apparatus for testing logic circuit designs Kedarnath Balakrishnan, Seongmoon Wang, Wenlong Wei 2009-10-27
7592935 Information retrieval architecture for packet classification Srihari Cadambi 2009-09-22
7581142 Method and system usable in sensor networks for handling memory faults Florin Sultan, Kiran Nagaraja, Ram Kumar RENGASWAMY 2009-08-25
7577540 Re-configurable embedded core test protocol for system-on-chips (SOC) and circuit boards Seongmoon Wang, Kedarnath Balakrishnan 2009-08-18
7562321 Method and apparatus for structured ASIC test point insertion Seongmoon Wang 2009-07-14
7529669 Voice-based multimodal speaker authentication using adaptive training and applications thereof Srivaths Ravi, Anand Raghunathan, Karthik Nandakumar 2009-05-05
7484151 Method and apparatus for testing logic circuit designs Kedarnath Balakrishnan, Seongmoon Wang, Wenlong Wei 2009-01-27
7474750 Dynamic content-aware memory compression and encryption architecture Haris Lekatsas, Joerg Henkel, Venkata Jakkula 2009-01-06
7398278 Prefix processing technique for faster IP routing Srihari Cadambi, Hirohiko Shibata 2008-07-08
7313746 Test output compaction for responses with unknown values Chia-Tso Chao, Seongmoon Wang 2007-12-25
7313743 Hybrid scan-based delay testing technique for compact and high fault coverage test set Seongmoon Wang, Xiao Liu 2007-12-25
7302626 Test pattern compression with pattern-independent design-independent seed compression Kedarnath Balakrishnan, Seongmoon Wang 2007-11-27
7302543 Compressed memory architecture for embedded systems Haris Lekatsas, Joerg Henkel, Venkata Jakkula 2007-11-27
7284176 Externally-loaded weighted random test pattern compression Seongmoon Wang 2007-10-16
7278123 System-level test architecture for delivery of compressed tests Srivaths Ravi, Anand Raghunathan, Loganathan Lingappan, Niraj K. Jha 2007-10-02
7222277 Test output compaction using response shaper Seongmoon Wang, Chia-Tso Chao 2007-05-22
7203935 Hardware/software platform for rapid prototyping of code compression technologies Jörg Henkel, Venkata Jakkula, Haris Lekatsas, Murugan Sankaradass 2007-04-10
7188323 Restricted scan reordering technique to enhance delay fault coverage Seongmoon Wang, Wei Li 2007-03-06