Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11163003 | Electronic device test database generating method and electronic device test database generating apparatus | Po-Lin Chen, Ying-Yen Chen, Tse-Wei Wu | 2021-11-02 |
| 10496505 | Integrated circuit test method | Wen-Hsuan Hsu, Ying-Yen Chen, Cheng-Yan Wen, Jih-Nung Lee | 2019-12-03 |
| 7313746 | Test output compaction for responses with unknown values | Seongmoon Wang, Srimat Chakradhar | 2007-12-25 |
| 7222277 | Test output compaction using response shaper | Seongmoon Wang, Srimat Chakradhar | 2007-05-22 |