Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10496505 | Integrated circuit test method | Wen-Hsuan Hsu, Ying-Yen Chen, Cheng-Yan Wen, Chia-Tso Chao | 2019-12-03 |
| 10416233 | Electronic apparatus and control method thereof | Chun-Yi Kuo, Ying-Yen Chen | 2019-09-17 |
| 10234503 | Debugging method executed via scan chain for scan test and related circuitry system | Chun-Yi Kuo, Ying-Yen Chen | 2019-03-19 |
| 9568553 | Method of integrated circuit scan clock domain allocation and machine readable media thereof | Ming-Chung Wu, Shuo-Fen Kuo, Ying-Yen Chen, Ching-Feng Su | 2017-02-14 |
| 9274543 | Estimation apparatus and method for estimating clock skew | Ying-Yen Chen | 2016-03-01 |
| 9157957 | PLL status detection circuit and method thereof | Chao-Wen Tzeng, Ying-Yen Chen | 2015-10-13 |
| 9160322 | Clock edge detection device and method | Yu-Cheng Lo, Ying-Yen Chen, Chao-Wen Tzeng | 2015-10-13 |
| 8984354 | Test system which shares a register in different modes | Shuo-Fen Kuo, Sung-Kuang Wu | 2015-03-17 |
| 8907709 | Delay difference detection and adjustment device and method | Yu-Cheng Lo, Ying-Yen Chen, Chao-Wen Tzeng | 2014-12-09 |
| 8901917 | Element measurement circuit and method thereof | Ying-Yen Chen, Chun-Yu Yang | 2014-12-02 |
| 8572444 | Memory apparatus and testing method thereof | Shuo-Fen Kuo, Chi-Feng Wu | 2013-10-29 |
| 8479060 | Memory with self-test function and method for testing the same | Shuo-Fen Kuo, Sung-Kuang Wu | 2013-07-02 |
| 7949919 | Microelectronic device and pin arrangement method thereof | Hsiang-Huang Wu, Ming-Je Li | 2011-05-24 |