Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9568553 | Method of integrated circuit scan clock domain allocation and machine readable media thereof | Ming-Chung Wu, Ying-Yen Chen, Jih-Nung Lee, Ching-Feng Su | 2017-02-14 |
| 8984354 | Test system which shares a register in different modes | Jih-Nung Lee, Sung-Kuang Wu | 2015-03-17 |
| 8572444 | Memory apparatus and testing method thereof | Jih-Nung Lee, Chi-Feng Wu | 2013-10-29 |
| 8479060 | Memory with self-test function and method for testing the same | Jih-Nung Lee, Sung-Kuang Wu | 2013-07-02 |