Issued Patents All Time
Showing 126–129 of 129 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5502646 | Selection of partial scan flip-flops to break feedback cycles | Arunkumar BALAKRISHNAN | 1996-03-26 |
| 5493505 | Initializable asynchronous circuit design | Savita Banerjee, Rabindra K. Roy | 1996-02-20 |
| 5461573 | VLSI circuits designed for testability and methods for producing them | Suman Kanjilal, Vishwani D. Agrawal | 1995-10-24 |
| 5377201 | Transitive closure based process for generating test vectors for VLSI circuit | Viswani Agrawal | 1994-12-27 |