KA

Kazutami Arimoto

Mitsubishi Electric: 162 patents #5 of 25,717Top 1%
RT Renesas Technology: 18 patents #77 of 3,337Top 3%
RE Renesas Electronics: 11 patents #284 of 4,529Top 7%
ML Mitsubishi Electric Engineering Company, Limited: 2 patents #81 of 352Top 25%
MD Mitsubisih Denki: 1 patents #26 of 381Top 7%
📍 Itami, JP: #2 of 1,436 inventorsTop 1%
Overall (All Time): #3,562 of 4,157,543Top 1%
195
Patents All Time

Issued Patents All Time

Showing 126–150 of 195 patents

Patent #TitleCo-InventorsDate
5696727 Semiconductor memory device provided with sense amplifier capable of high speed operation with low power consumption Masaki Tsukude, Shigeki Tomishima 1997-12-09
5694364 Semiconductor integrated circuit device having a test mode for reliability evaluation Fukashi Morishita, Masaki Tsukude 1997-12-02
5687123 Semiconductor memory device Hideto Hidaka, Mikio Asakura, Kazuyasu Fujishima, Tsukasa Ooishi, Shigeki Tomishima +1 more 1997-11-11
5666315 Semiconductor memory device having a redundancy function suppressible of leakage current from a defective memory cell Masaki Tsukude 1997-09-09
5659517 Semiconductor memory device with an improved hierarchical power supply line configuration Masaki Tsukude 1997-08-19
5657286 Semiconductor memory device having improved manner of data line connection in hierarchical data line structure 1997-08-12
5650972 Semiconductor memory device having power line arranged in a meshed shape Shigeki Tomishima, Mikio Asakura, Hideto Hidaka 1997-07-22
5646900 Sense amplifier including MOS transistors having threshold voltages controlled dynamically in a semiconductor memory device Masaki Tsukude 1997-07-08
5636163 Random access memory with a plurality amplifier groups for reading and writing in normal and test modes Kiyohiro Furutani, Koichiro Mashiko, Noriaki Matsumoto, Yoshio Matsuda 1997-06-03
5633831 Semiconductor memory device having self-refreshing function Masaki Tsukude 1997-05-27
5631870 Semiconductor memory 1997-05-20
5617369 Dynamic semiconductor memory device having excellent charge retention characteristics Shigeki Tomishima 1997-04-01
5612919 Method of testing an operation of a semiconductor memory device and semiconductor memory device which can be subjected to such an operation test 1997-03-18
5610533 Switched substrate bias for logic circuits Masaki Tsukude 1997-03-11
5604707 Semiconductor memory device responsive to hierarchical internal potentials Shigehiro Kuge, Shigeki Tomishima, Hideto Hidaka, Takahiro Tsuruda 1997-02-18
5604710 Arrangement of power supply and data input/output pads in semiconductor memory device Shigeki Tomishima, Mikio Asakura, Masaki Tsukude 1997-02-18
5602793 Semiconductor memory device having power line arranged in a meshed shape Shigeki Tomishima, Mikio Asakura, Hideto Hidaka 1997-02-11
5568440 Semiconductor memory device having self-refreshing function Masaki Tsukude 1996-10-22
5537073 Circuitry and method for clamping a boost signal 1996-07-16
5519657 Semiconductor memory device having a redundant memory array and a testing method thereof 1996-05-21
5513142 Semiconductor memory device for maintaining level of signal line Shigeki Tomishima, Hideto Hidaka 1996-04-30
5510749 Circuitry and method for clamping a boost signal 1996-04-23
5504713 Semiconductor memory device with redundancy circuit Tsukasa Ooishi, Yoshio Matsuda, Masaki Tsukude, Kazuyasu Fujishima 1996-04-02
5426615 Semiconductor memory device having power line arranged in a meshed shape Shigeki Tomishima, Mikio Asakura, Hideto Hidaka 1995-06-20
5375088 Random access memory with plurality of amplifier groups Kiyohiro Furutani, Koichiro Mashiko, Noriaki Matsumoto, Yoshio Matsuda 1994-12-20