SK

Shigehiro Kuge

Mitsubishi Electric: 12 patents #2,296 of 25,717Top 9%
RT Renesas Technology: 12 patents #178 of 3,337Top 6%
MD Mitsubisih Denki: 1 patents #26 of 381Top 7%
📍 Kasai, JP: #278 of 5,842 inventorsTop 5%
Overall (All Time): #165,484 of 4,157,543Top 4%
25
Patents All Time

Issued Patents All Time

Showing 1–25 of 25 patents

Patent #TitleCo-InventorsDate
7365578 Semiconductor device with pump circuit Minoru Senda, Kiyohiro Furutani, Taku Ogura, Satoshi Kawasaki, Tadaaki Yamauchi 2008-04-29
7268612 Semiconductor device with pump circuit Minoru Senda, Kiyohiro Furutani, Taku Ogura, Satoshi Kawasaki, Tadaaki Yamauchi 2007-09-11
7180362 Semiconductor device with pump circuit Minoru Senda, Kiyohiro Furutani, Taku Ogura, Satoshi Kawasaki, Tadaaki Yamauchi 2007-02-20
7157773 Nonvolatile semiconductor memory device Hiroshi Kato, Hideyuki Noda, Fukashi Morishita, Shuichi Ueno 2007-01-02
6962827 Semiconductor device capable of shortening test time and suppressing increase in chip area, and method of manufacturing semiconductor integrated circuit device Katsuya Furue, Shigeru Kikuda, Kiyohiro Furutani, Tetsushi Tanizaki, Takashi Kono 2005-11-08
6897523 Semiconductor device Shuichi Ueno, Haruo Furuta, Hiroshi Kato 2005-05-24
6850454 Semiconductor memory device with reduced current consumption during standby state Takeshi Hamamoto 2005-02-01
6809975 Semiconductor memory device having test mode and memory system using the same Shigeru Yamaoka 2004-10-26
6781900 Semiconductor memory device with enhanced reliability Kiyohiro Furutani, Takeshi Hamamoto, Takashi Kubo 2004-08-24
6777976 Interface circuit and semiconductor device with the same 2004-08-17
6731535 Nonvolatile semiconductor memory device Tsukasa Ooishi, Shuichi Ueno 2004-05-04
6715096 Interface circuit device for performing data sampling at optimum strobe timing by using stored data window information to determine the strobe timing 2004-03-30
6466496 Semiconductor integrated circuit having circuit for data transmission distance measurement and memory processing system with the same 2002-10-15
6438067 Clock generating circuit ensuring a wide lock-allowing frequency range and allowing reduction in layout area as well as a semiconductor device provided with the same Takeshi Hamamoto 2002-08-20
6424593 Semiconductor memory device capable of adjusting internal parameter Tetsuo Kato 2002-07-23
6414891 Semiconductor device including complementary data bus pair Takeshi Hamamoto 2002-07-02
6404056 Semiconductor integrated circuit Kazutami Arimoto, Masaki Tsukude, Kazuyasu Fujishima 2002-06-11
6388329 Semiconductor integrated circuit having three wiring layers Kazutami Arimoto 2002-05-14
6351169 Internal clock signal generating circuit permitting rapid phase lock 2002-02-26
6339553 Clock generating circuit having additional delay line outside digital DLL loop and semiconductor memory device including the same 2002-01-15
6157052 Semiconductor integrated circuit having three wiring layers Kazutami Arimoto 2000-12-05
5969420 Semiconductor device comprising a plurality of interconnection patterns Kazutami Arimoto, Masaki Tsukude, Kazuyasu Fujishima 1999-10-19
5847420 Semiconductor integrated circuit having three wiring layers Kazutami Arimoto 1998-12-08
5818772 Semiconductor memory devices having a built-in test function 1998-10-06
5604707 Semiconductor memory device responsive to hierarchical internal potentials Shigeki Tomishima, Kazutami Arimoto, Hideto Hidaka, Takahiro Tsuruda 1997-02-18