Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6962827 | Semiconductor device capable of shortening test time and suppressing increase in chip area, and method of manufacturing semiconductor integrated circuit device | Shigeru Kikuda, Kiyohiro Furutani, Tetsushi Tanizaki, Shigehiro Kuge, Takashi Kono | 2005-11-08 |
| 6900691 | Semiconductor integrated circuit | — | 2005-05-31 |
| 6646461 | Method and apparatus for testing semiconductor devices using improved testing sequence | Kazushi Sugiura | 2003-11-11 |