HH

Hideto Hidaka

Mitsubishi Electric: 178 patents #3 of 25,717Top 1%
RT Renesas Technology: 107 patents #1 of 3,337Top 1%
ML Mitsubishi Electric Engineering Company, Limited: 11 patents #11 of 352Top 4%
RE Renesas Electronics: 8 patents #458 of 4,529Top 15%
MC Mitsubishi Chemical: 3 patents #645 of 3,022Top 25%
MD Mitsubisih Denki: 3 patents #2 of 381Top 1%
TO Toyota: 2 patents #10,861 of 26,838Top 45%
WR West Japan Railway: 1 patents #9 of 24Top 40%
Overall (All Time): #1,268 of 4,157,543Top 1%
302
Patents All Time

Issued Patents All Time

Showing 226–250 of 302 patents

Patent #TitleCo-InventorsDate
5844767 Level converting circuit for converting level of an input signal, internal potential generating circuit for generating internal potential, internal potential generating unit generating internal potential highly reliable semiconductor device and method of Yuichiro Komiya, Tsukasa Ooishi, Mikio Asakura 1998-12-01
5828258 Semiconductor device and testing apparatus thereof Tsukasa Ooishi, Tomoya Kawagoe, Mikio Asakura 1998-10-27
5825696 Semiconductor memory device including an SOI substrate Katsuhiro Suma, Takahiro Tsuruda 1998-10-20
5815454 Semiconductor memory device having power line arranged in a meshed shape Shigeki Tomishima, Mikio Asakura, Kazutami Arimoto 1998-09-29
5793686 Semiconductor memory device having data input/output circuit of small occupied area capable of high-speed data input/output Kiyohiro Furutani, Tsukasa Ooishi, Mikio Asakura, Kei Hamade, Yoshito Nakaoka 1998-08-11
5773865 Semiconductor memory and semiconductor device having SOI structure Takahiro Tsuruda 1998-06-30
5764576 Semiconductor memory device and method of checking same for defect Mikio Asakura, Kiyohiro Furutani, Tetsuo Kato 1998-06-09
5760614 Potential detecting circuit and semiconductor integrated circuit Tsukasa Ooishi, Mikio Asakura 1998-06-02
5740119 Semiconductor memory device having internal address converting function, whose test and layout are conducted easily Mikio Asakura, Kiyohiro Furutani, Kenichi Yasuda 1998-04-14
5726940 Semiconductor memory device of which prescribed state of operation is terminated under a prescribed condition and method of operating a semiconductor memory device for terminating prescribed state of operation Mikio Asakura, Kiyohiro Furutani 1998-03-10
5724293 Semiconductor memory device having power line arranged in a meshed shape Shigeki Tomishima, Mikio Asakura, Kazutami Arimoto 1998-03-03
5708610 Semiconductor memory device and semiconductor device Yasuhiko Okasaka, Mikio Asakura, Masaaki Ura, Fukashi Morishita 1998-01-13
5701090 Data output circuit with reduced output noise Masakazu Hirose 1997-12-23
5687123 Semiconductor memory device Mikio Asakura, Kazuyasu Fujishima, Tsukasa Ooishi, Kazutami Arimoto, Shigeki Tomishima +1 more 1997-11-11
5668755 Semiconductor memory device having well region 1997-09-16
5652730 Semiconductor memory device having hierarchical boosted power-line scheme Takashi Kono, Kiyohiro Furutani, Mikio Asakura 1997-07-29
5650972 Semiconductor memory device having power line arranged in a meshed shape Shigeki Tomishima, Mikio Asakura, Kazutami Arimoto 1997-07-22
5650975 Semiconductor memory device having improved hierarchical I/O line pair structure Kei Hamade, Kenichi Yasuda, Mikio Asakura 1997-07-22
5635744 Semiconductor memory and semiconductor device having SOI structure Takahiro Tsuruda, Katsuhiro Suma 1997-06-03
5610871 Semiconductor memory device having a hierarchical bit line structure with reduced interference noise 1997-03-11
5604707 Semiconductor memory device responsive to hierarchical internal potentials Shigehiro Kuge, Shigeki Tomishima, Kazutami Arimoto, Takahiro Tsuruda 1997-02-18
5602793 Semiconductor memory device having power line arranged in a meshed shape Shigeki Tomishima, Mikio Asakura, Kazutami Arimoto 1997-02-11
5592009 Semiconductor device having a floating node that can maintain a predetermined potential for long time, a semiconductor memory device having high data maintenance performance, and a method of manufacturing thereof 1997-01-07
5574397 Signal output circuit operating stably and arrangement of power supply interconnection line therefor in semiconductor integrated circuit device Shigeki Tomishima, Masakazu Hirose, Takahiro Tsuruda 1996-11-12
5566799 Low aerodynamic noise type current collection equipment Kengo Iwamoyto, Yasuhiro Noguchi, Motohiro Miyamura, Seiichi Yazima, Inao Sakai 1996-10-22