HN

Hideharu Nobutoki

Mitsubishi Electric: 17 patents #1,334 of 25,717Top 6%
NC Nippon Shokubai Co.: 2 patents #486 of 1,108Top 45%
RE Renesas Electronics: 1 patents #2,739 of 4,529Top 65%
RT Renesas Technology: 1 patents #1,991 of 3,337Top 60%
Overall (All Time): #220,018 of 4,157,543Top 6%
20
Patents All Time

Issued Patents All Time

Showing 1–20 of 20 patents

Patent #TitleCo-InventorsDate
11814567 Heat storage material, method of producing same, and heat storage tank 2023-11-14
11448471 Heat storage unit, heat storage system, and heat storage method Yasumitsu NOMURA, Shigetoshi Ipposhi, Shunkei Suzuki, Junichi Nakazono 2022-09-20
8846148 Composition for chemical vapor deposition film-formation and method for production of low dielectric constant film Teruhiko Kumada, Naoki Yasuda, Tetsuya Yamamoto, Yasutaka Nakatani, Takuya Kamiyama 2014-09-30
8674046 Source material for preparing low dielectric constant material Teruhiko Kumada, Toshiyuki Toyoshima, Naoki Yasuda, Suguru Nagae 2014-03-18
8404314 Plasma CVD apparatus, method for forming thin film and semiconductor device Teruhiko Kumada, Naoki Yasuda 2013-03-26
8288294 Insulating film for semiconductor device, process and apparatus for producing insulating film for semiconductor device, semiconductor device, and process for producing the semiconductor device Hidetaka Kafuku, Toshihito FUJIWARA, Toshihiko Nishimori, Tadashi Shimazu, Naoki Yasuda +4 more 2012-10-16
7981790 Semiconductor device and method of fabricating the same Teruhiko Kumada, Naoki Yasuda, Kinya Goto, Masazumi Matsuura 2011-07-19
7824784 Composition for low dielectric material, low dielectric material and method for production thereof Teruhiko Kumada, Tetsuya Yamamoto, Takuya Kamiyama 2010-11-02
7671473 Semiconductor device and method of fabricating the same Teruhiko Kumada, Naoki Yasuda, Kinya Goto, Masazumi Matsuura 2010-03-02
7192540 Low dielectric constant material having thermal resistance, insulation film between semiconductor layers using the same, and semiconductor device Sei Tsunoda, Noboru Mikami 2007-03-20
7175718 Rare earth element permanent magnet material Suguru Nagae, Satoru Hayasi 2007-02-13
7029605 Low dielectric constant material having thermal resistance, insulation film between semiconductor layers using the same, and semiconductor device Sei Tsunoda, Noboru Mikami 2006-04-18
7030007 Via-filling material and process for fabricating semiconductor integrated circuit using the material Teruhiko Kumada, Toshiyuki Toyoshima, Takeo Ishibashi, Yoshiharu Ono, Junjiro Sakai 2006-04-18
6924240 Low dielectric constant material, insulating film comprising the low dielectric constant material, and semiconductor device Teruhiko Kumada, Toshiyuki Toyoshima, Naoki Yasuda, Suguru Nagae 2005-08-02
6704663 Method of calculating magnetic interaction of molecules using localized magnetic orbital Suguru Nagae 2004-03-09
6458719 LOW DIELECTRIC CONSTANT FILM COMPOSED OF BORON, NITROGEN, AND HYDROGEN HAVING THERMAL RESISTANCE, PROCESS FOR FORMING THE FILM, USE OF THE FILM BETWEEN SEMICONDUCTOR DEVICE LAYERS, AND THE DEVICE FORMED FROM THE FILM Sei Tsunoda, Noboru Mikami 2002-10-01
6086794 Organic nonlinear optical material and nonlinear optical element using the same Tetsuyuki Kurata 2000-07-11
5844820 Method for simulating properties of material having periodically repeated structure and systems utilizing the same 1998-12-01
5694343 System for simulating properties of a material having periodically repeated structure 1997-12-02
5500537 Field-effect transistor with at least two different semiconductive organic channel compounds Akira Tsumura, Hiroyuki Fuchigami, Hiroshi Koezuka 1996-03-19