Issued Patents All Time
Showing 1–25 of 52 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12394501 | Apparatus with adjustable diagnostic mechanism and methods for operating the same | Takuya Tamano, Daniel S. Miller | 2025-08-19 |
| 12394456 | Apparatuses and methods including dice latches in a semiconductor device | Yoshiro Riho, Hiroshi Akamatsu, Jian Long, Kevin G. Werhane, Liang Liu | 2025-08-19 |
| 12354694 | Apparatuses and methods for dynamic column select swapping | Kristopher Kopel, Kosei Kudo | 2025-07-08 |
| 12100467 | Systems and methods for testing redundant fuse latches in a memory device | Takuya Tamano, Jason Johnson, Kevin G. Werhane, Daniel S. Miller | 2024-09-24 |
| 12100476 | Test mode security circuit | Kari Crane, Kevin G. Werhane, Jason Johnson, Takuya Tamano, Daniel S. Miller | 2024-09-24 |
| 12079076 | Apparatuses, systems, and methods for error correction | Vivek Kotti, Christopher G. Wieduwilt, Jason Johnson, Kevin G. Werhane | 2024-09-03 |
| 12061795 | Repair element availability communication | Loren Jeffrey Wooley, Randall J. Rooney | 2024-08-13 |
| 11955160 | Asynchronous signal to command timing calibration for testing accuracy | Kevin G. Werhane, Jason Johnson, Daniel S. Miller | 2024-04-09 |
| 11915775 | Apparatuses and methods for bad row mode | Jack Riley, Scott E. Smith, Christian Mohr, Gary L. Howe, Joshua E. Alzheimer +2 more | 2024-02-27 |
| 11791011 | Self-repair verification | Takuya Tamano | 2023-10-17 |
| 11783909 | Systems and methods for power savings in row repaired memory | James S. Rehmeyer | 2023-10-10 |
| 11742044 | Memory built-in self-test with adjustable pause time | Daniel S. Miller | 2023-08-29 |
| 11727967 | Apparatuses and methods including dice latches in a semiconductor device | Yoshiro Riho, Hiroshi Akamatsu, Jian Long, Kevin G. Werhane, Liang Liu | 2023-08-15 |
| 11705214 | Apparatuses and methods for self-test mode abort circuit | — | 2023-07-18 |
| 11670356 | Apparatuses and methods for refresh address masking | Harish V. Gadamsetty, Gary L. Howe, Dennis G. Montierth, Michael A. Shore, Jason Johnson | 2023-06-06 |
| 11645134 | Apparatuses and methods for fuse error detection | Daniel S. Miller, Kevin G. Werhane, Christopher G. Wieduwilt, Jason Johnson, Minoru Someya | 2023-05-09 |
| 11417411 | Systems and methods for power savings in row repaired memory | James S. Rehmeyer | 2022-08-16 |
| 11410742 | Microelectronic device testing, and related devices, systems, and methods | — | 2022-08-09 |
| 11342042 | Interconnected command/address resources | Jason Johnson, Kevin G. Werhane | 2022-05-24 |
| 11263078 | Apparatuses, systems, and methods for error correction | Vivek Kotti, Christopher G. Wieduwilt, Jason Johnson, Kevin G. Werhane | 2022-03-01 |
| 11183260 | Transmit line monitoring circuitry, and related methods, devices, and systems | Dave Jefferson, Jason Johnson, Vivek Kotti, Minoru Someya, Toru Ishikawa +1 more | 2021-11-23 |
| 11170837 | Identifying high impedance faults in a memory device | Daniel S. Miller | 2021-11-09 |
| 11081166 | Memory device random option inversion | Kevin G. Werhane, Jason Johnson, Tyrel Z. Jensen, Daniel S. Miller, David Jefferson +1 more | 2021-08-03 |
| 10969434 | Methods and apparatuses to detect test probe contact at external terminals | Timothy O'Neil, Tomio Okuda | 2021-04-06 |
| 10930327 | Memory read masking | Dave Jefferson, C. Omar Benitez, Christopher S. Wieduwilt, Vivek Kotti, Dennis G. Montierth +4 more | 2021-02-23 |