| 12394456 |
Apparatuses and methods including dice latches in a semiconductor device |
Yoshiro Riho, Hiroshi Akamatsu, Jian Long, Liang Liu, Yoshinori Fujiwara |
2025-08-19 |
| 12333191 |
Apparatus with calibration input mechanism and methods for operating the same |
Vijayakrishna J. Vankayala, Tyrel Z. Jensen |
2025-06-17 |
| 12100467 |
Systems and methods for testing redundant fuse latches in a memory device |
Yoshinori Fujiwara, Takuya Tamano, Jason Johnson, Daniel S. Miller |
2024-09-24 |
| 12100476 |
Test mode security circuit |
Kari Crane, Yoshinori Fujiwara, Jason Johnson, Takuya Tamano, Daniel S. Miller |
2024-09-24 |
| 12079076 |
Apparatuses, systems, and methods for error correction |
Yoshinori Fujiwara, Vivek Kotti, Christopher G. Wieduwilt, Jason Johnson |
2024-09-03 |
| 11955160 |
Asynchronous signal to command timing calibration for testing accuracy |
Yoshinori Fujiwara, Jason Johnson, Daniel S. Miller |
2024-04-09 |
| 11727967 |
Apparatuses and methods including dice latches in a semiconductor device |
Yoshiro Riho, Hiroshi Akamatsu, Jian Long, Liang Liu, Yoshinori Fujiwara |
2023-08-15 |
| 11675589 |
Serial interfaces with shadow registers, and associated systems, devices, and methods |
Daniel S. Miller |
2023-06-13 |
| 11645134 |
Apparatuses and methods for fuse error detection |
Daniel S. Miller, Yoshinori Fujiwara, Christopher G. Wieduwilt, Jason Johnson, Minoru Someya |
2023-05-09 |
| 11342042 |
Interconnected command/address resources |
Jason Johnson, Yoshinori Fujiwara |
2022-05-24 |
| 11263078 |
Apparatuses, systems, and methods for error correction |
Yoshinori Fujiwara, Vivek Kotti, Christopher G. Wieduwilt, Jason Johnson |
2022-03-01 |
| 11183260 |
Transmit line monitoring circuitry, and related methods, devices, and systems |
Yoshinori Fujiwara, Dave Jefferson, Jason Johnson, Vivek Kotti, Minoru Someya +1 more |
2021-11-23 |
| 11081166 |
Memory device random option inversion |
Jason Johnson, Yoshinori Fujiwara, Tyrel Z. Jensen, Daniel S. Miller, David Jefferson +1 more |
2021-08-03 |
| 11054468 |
Segmented digital die ring |
Nathaniel J. Meier |
2021-07-06 |
| 10984884 |
Configurable associated repair addresses and circuitry for a memory device |
Christopher G. Wieduwilt |
2021-04-20 |
| 10930327 |
Memory read masking |
Dave Jefferson, C. Omar Benitez, Yoshinori Fujiwara, Christopher S. Wieduwilt, Vivek Kotti +4 more |
2021-02-23 |
| 10825544 |
Configurable post-package repair |
Christopher G. Wieduwilt |
2020-11-03 |
| 10663513 |
Apparatuses including test segment circuits having latch circuits for testing a semiconductor die |
Nathaniel J. Meier, Bin Liu |
2020-05-26 |
| 10410994 |
Single interconnect index pointer for stacked die address encoding |
Jason Johnson |
2019-09-10 |
| 10330726 |
Apparatuses including test segment circuits having latch circuits for testing a semiconductor die |
Nathaniel J. Meier, Bin Liu |
2019-06-25 |
