Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12394501 | Apparatus with adjustable diagnostic mechanism and methods for operating the same | Yoshinori Fujiwara, Daniel S. Miller | 2025-08-19 |
| 12100467 | Systems and methods for testing redundant fuse latches in a memory device | Yoshinori Fujiwara, Jason Johnson, Kevin G. Werhane, Daniel S. Miller | 2024-09-24 |
| 12100476 | Test mode security circuit | Kari Crane, Kevin G. Werhane, Yoshinori Fujiwara, Jason Johnson, Daniel S. Miller | 2024-09-24 |
| 11791011 | Self-repair verification | Yoshinori Fujiwara | 2023-10-17 |