Issued Patents All Time
Showing 26–50 of 52 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10923172 | Apparatuses and methods for multi-bank refresh timing | Jason Johnson, Christopher G. Wieduwilt, Daniel S. Miller | 2021-02-16 |
| 10593392 | Apparatuses and methods for multi-bank refresh timing | Jason Johnson, Christopher G. Wieduwilt, Daniel S. Miller | 2020-03-17 |
| 10056154 | Apparatuses and methods for flexible fuse transmission | Kenji Yoshida, Minoru Someya, Hiromasa Noda | 2018-08-21 |
| 9824770 | Apparatuses and methods for flexible fuse transmission | Kenji Yoshida, Minoru Someya, Hiromasa Noda | 2017-11-21 |
| 9666307 | Apparatuses and methods for flexible fuse transmission | Kenji Yoshida, Minoru Someya, Hiromasa Noda | 2017-05-30 |
| 9293191 | Apparatuses and methods for multi-memory array accesses | Yuan He | 2016-03-22 |
| 8736291 | Methods for defect testing of externally accessible integrated circuit interconnects | Masayoshi Nomura | 2014-05-27 |
| 8582377 | Redundant memory array for replacing memory sections of main memory | — | 2013-11-12 |
| 8230274 | JTAG controlled self-repair after packaging | Masayoshi Nomura | 2012-07-24 |
| 8223583 | Row addressing | Takuya Nakanishi, Takumi Nasu | 2012-07-17 |
| 8159890 | Redundant memory array for replacing memory sections of main memory | — | 2012-04-17 |
| 8122304 | JTAG controlled self-repair after packaging | Masayoshi Nomura | 2012-02-21 |
| 7990163 | Systems and methods for defect testing of externally accessible integrated circuit interconnects | Masayoshi Nomura | 2011-08-02 |
| 7933162 | Row addressing | Takuya Nakanishi, Takumi Nasu | 2011-04-26 |
| 7910061 | Colorimetric absorbance measurement apparatus | Yasuhiro Higuchi | 2011-03-22 |
| 7885128 | Redundant memory array for replacing memory sections of main memory | — | 2011-02-08 |
| 7831870 | JTAG controlled self-repair after packaging | Masayoshi Nomura | 2010-11-09 |
| 7721163 | JTAG controlled self-repair after packaging | Masayoshi Nomura | 2010-05-18 |
| 7612574 | Systems and methods for defect testing of externally accessible integrated circuit interconnects | Masayoshi Nomura | 2009-11-03 |
| 7403444 | Selectable memory word line deactivation | — | 2008-07-22 |
| 7196964 | Selectable memory word line deactivation | — | 2007-03-27 |
| 7000156 | Devices for storing and accumulating defect information, semiconductor device and device for testing the same | Yutaka Shimada | 2006-02-14 |
| 6897415 | Workpiece stage of a resist curing device | Yasuhiko Kenjo, Yoshihiko Watanabe | 2005-05-24 |
| 6853177 | Semiconductor device with process monitor circuit and test method thereof | Mari Shibayama, Yoshihiro Nagura | 2005-02-08 |
| 6667915 | Semiconductor memory device having redundancy structure with defect relieving function | Toshiaki Yonezu | 2003-12-23 |