Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6853177 | Semiconductor device with process monitor circuit and test method thereof | Yoshinori Fujiwara, Yoshihiro Nagura | 2005-02-08 |
| 6708302 | Semiconductor module | Ryuji Ohmura, Yukiyoshi Koda, Kazushi Sugiura | 2004-03-16 |
| 6584592 | Semiconductor testing apparatus for testing semiconductor device including built in self test circuit | Ryuji Omura, Kazushi Sugiura | 2003-06-24 |
| 6311300 | Semiconductor testing apparatus for testing semiconductor device including built in self test circuit | Ryuji Omura, Kazushi Sugiura | 2001-10-30 |