Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6584592 | Semiconductor testing apparatus for testing semiconductor device including built in self test circuit | Kazushi Sugiura, Mari Shibayama | 2003-06-24 |
| 6345004 | Repair analysis circuit for redundancy, redundant repairing method, and semiconductor device | Kazushi Sugiura, Tatsunori Komoike | 2002-02-05 |
| 6311300 | Semiconductor testing apparatus for testing semiconductor device including built in self test circuit | Kazushi Sugiura, Mari Shibayama | 2001-10-30 |
| 5164665 | IC tester | Eisaku Yamashita | 1992-11-17 |
| 5142223 | Device for testing semiconductor device | Naomi Higashino | 1992-08-25 |