Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7662647 | Method for manufacturing semiconductor device | Shigeru Takada | 2010-02-16 |
| 7498180 | Method for manufacturing semiconductor device | Shigeru Takada | 2009-03-03 |
| 6223318 | IC tester having region in which various test conditions are stored | Ryuji Oomura, Yasuyuki Ochi | 2001-04-24 |
| 5430737 | Apparatus for testing function of integrated circuit | Ryuuji Omura | 1995-07-04 |
| 5164665 | IC tester | Ryuji Omura | 1992-11-17 |