Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12354694 | Apparatuses and methods for dynamic column select swapping | Yoshinori Fujiwara, Kosei Kudo | 2025-07-08 |
| 12211571 | On-die testing for a memory device | David W. Overgaard, Andrew P. Lyle, Glen E. Hush, Timothy P. Finkbeiner, Jonathan D. Harms | 2025-01-28 |
| 12007860 | Salvaging bad blocks in a memory device | Sri Rama Namala, Lu Tong, Sheng-Huang Lee, Chang Hua Siau | 2024-06-11 |
| 11537484 | Salvaging bad blocks in a memory device | Sri Rama Namala, Lu Tong, Sheng-Huang Lee, Chang Hua Siau | 2022-12-27 |
| 8086916 | System and method for running test and redundancy analysis in parallel | — | 2011-12-27 |