Issued Patents All Time
Showing 126–150 of 226 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11361831 | Proactive read disturb mitigation | Saeed Sharifi Tehrani | 2022-06-14 |
| 11355203 | Determine optimized read voltage via identification of distribution shape of signal and noise characteristics | AbdelHakim S. Alhussien, James Fitzpatrick, Patrick R. Khayat | 2022-06-07 |
| 11349498 | Bit flipping low-density parity-check decoders with low error floor | Mustafa N. Kaynak | 2022-05-31 |
| 11334413 | Estimating an error rate associated with memory | Mustafa N. Kaynak, Patrick R. Khayat, Nicholas J. Richardson | 2022-05-17 |
| 11276473 | Coarse calibration based on signal and noise characteristics of memory cells collected in prior calibration operations | Patrick R. Khayat, James Fitzpatrick, AbdelHakim S. Alhussien | 2022-03-15 |
| 11275515 | Descrambling of scrambled linear codewords using non-linear scramblers | Patrick R. Khayat, Mustafa N. Kaynak | 2022-03-15 |
| 11257565 | Management of test resources to perform testing of memory components under different temperature conditions | Aswin Thiruvengadam, Daniel G. Scobee, Frederick Jensen | 2022-02-22 |
| 11257546 | Reading of soft bits and hard bits from memory cells | James Fitzpatrick, Patrick R. Khayat, AbdelHakim S. Alhussien | 2022-02-22 |
| 11244729 | Search for an optimized read voltage | Patrick R. Khayat, James Fitzpatrick, AbdelHakim S. Alhussien | 2022-02-08 |
| 11237726 | Memory system performance enhancements using measured signal and noise characteristics of memory cells | James Fitzpatrick, Patrick R. Khayat, AbdelHakim S. Alhussien, Violante Moschiano | 2022-02-01 |
| 11238953 | Determine bit error count based on signal and noise characteristics centered at an optimized read voltage | Patrick R. Khayat, James Fitzpatrick | 2022-02-01 |
| 11227666 | Track charge loss based on signal and noise characteristics of memory cells collected in calibration operations | James Fitzpatrick, Patrick R. Khayat, AbdelHakim S. Alhussien | 2022-01-18 |
| 11221800 | Adaptive and/or iterative operations in executing a read command to retrieve data from memory cells | James Fitzpatrick, Patrick R. Khayat, AbdelHakim S. Alhussien | 2022-01-11 |
| 11221912 | Mitigating an undetectable error when retrieving critical data during error handling | Vamsi Pavan Rayaprolu, Sampath K. Ratnam, Shane Nowell, Renato C. Padilla | 2022-01-11 |
| 11205495 | Read disturb mitigation based on signal and noise characteristics of memory cells collected for read calibration | Patrick R. Khayat, James Fitzpatrick, AbdelHakim S. Alhussien | 2021-12-21 |
| 11200959 | Optimization of soft bit windows based on signal and noise characteristics of memory cells | James Fitzpatrick, Patrick R. Khayat, AbdelHakim S. Alhussien | 2021-12-14 |
| 11177013 | Determine signal and noise characteristics centered at an optimized read voltage | Patrick R. Khayat, James Fitzpatrick | 2021-11-16 |
| 11170847 | Determining soft data for fractional digit memory cells | Patrick R. Khayat, Mustafa N. Kaynak | 2021-11-09 |
| 11163488 | Extended cross-temperature handling in a memory sub-system | Vamsi Pavan Rayaprolu, Sampath K. Ratnam, Mustafa N. Kaynak, Kishore Kumar Muchherla, Shane Nowell +2 more | 2021-11-02 |
| 11152073 | Iterative read calibration enhanced according to patterns of shifts in read voltages | James Fitzpatrick, Patrick R. Khayat, AbdelHakim S. Alhussien | 2021-10-19 |
| 11146291 | Configuring iterative error correction parameters using criteria from previous iterations | Eyal En Gad, Zhengang Chen, Yoav Weinberg | 2021-10-12 |
| 11131705 | Allocation of test resources to perform a test of memory components | Aswin Thiruvengadam, Frederick Jensen | 2021-09-28 |
| 11132037 | Operating temperature management of a memory sub-system | Shane Nowell | 2021-09-28 |
| 11133083 | Read model of memory cells using information generated during read operations | James Fitzpatrick, Patrick R. Khayat, AbdelHakim S. Alhussien | 2021-09-28 |
| 11101015 | Multi-dimensional usage space testing of memory components | Aswin Thiruvengadam, Preston A. Thomson | 2021-08-24 |