Issued Patents All Time
Showing 26–50 of 122 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6955996 | Method for stabilizing high pressure oxidation of a semiconductor device | Daniel Gealy, Dave Chapek, Husam N. Al-Shareef, Randhir P. S. Thakur | 2005-10-18 |
| 6949477 | Method of fabricating a capacitive element for a semiconductor device | Ronald A. Weimer, Dan Gealy, Husam N. Al-Shareef | 2005-09-27 |
| 6927179 | Methods and apparatus for forming a high dielectric film and the dielectric film formed thereby | Randhir P. S. Thakur | 2005-08-09 |
| 6914017 | Residue free overlay target | Pary Baluswamy, Ceredig Roberts, Tim H. Bossart | 2005-07-05 |
| 6891215 | Capacitors | John T. Moore | 2005-05-10 |
| 6887774 | Conductor layer nitridation | Yongjun Jeff Hu, Randhir P. S. Thakur | 2005-05-03 |
| 6878587 | Method and structure for reducing contact aspect ratios | Vishnu K. Agarwal | 2005-04-12 |
| 6878585 | Methods of forming capacitors | John T. Moore | 2005-04-12 |
| 6875707 | Method of forming a capacitor dielectric layer | John T. Moore | 2005-04-05 |
| 6872639 | Fabrication of semiconductor devices with transition metal boride films as diffusion barriers | Husam N. Al-Shareef | 2005-03-29 |
| 6864527 | Capacitor having tantalum oxynitride film and method for making same | Husam N. Al-Shareef, Randhir P. S. Thakur, Dan Gealy | 2005-03-08 |
| 6858523 | Semiconductor processing methods of transferring patterns from patterned photoresists to materials, and structures comprising silicon nitride | John T. Moore | 2005-02-22 |
| 6825522 | Capacitor electrode having an interface layer of different chemical composition formed on a bulk layer | Don Powell | 2004-11-30 |
| 6822342 | Raised-lines overlay semiconductor targets and method of making the same | Pary Baluswamy, Ceredig Roberts, Tim H. Bossart | 2004-11-23 |
| 6798026 | Conductor layer nitridation | Yongjun Jeff Hu, Randhir P. S. Thakur | 2004-09-28 |
| 6794703 | High pressure reoxidation/anneal of high dielectric constant | Randhir P. S. Thakur | 2004-09-21 |
| 6773981 | Methods of forming capacitors | Husam N. Al-Shareef, F. Daniel Gealy, Randhir P. S. Thakur | 2004-08-10 |
| 6756634 | Gated semiconductor assemblies | Mark A. Helm, Mark Fischer, John T. Moore | 2004-06-29 |
| 6720609 | Structure for reducing contact aspect ratios | Vishnu K. Agarwal | 2004-04-13 |
| 6696336 | Double sided container process used during the manufacture of a semiconductor device | Ronald A. Weimer, John T. Moore | 2004-02-24 |
| 6693345 | Semiconductor wafer assemblies comprising photoresist over silicon nitride materials | John T. Moore, Mark Fischer, J. Brett Rolfson, Annette L. Martin, Ardavan Niroomand | 2004-02-17 |
| 6693320 | Capacitor structures with recessed hemispherical grain silicon | Whonchee Lee | 2004-02-17 |
| 6677661 | Semiconductive wafer assemblies | John T. Moore, Mark Fischer, Randhir P. S. Thakur | 2004-01-13 |
| 6677636 | Structure for reducing contact aspect ratios | Vishnu K. Agarwal | 2004-01-13 |
| 6673689 | Double layer electrode and barrier system on hemispherical grain silicon for use with high dielectric constant materials and methods for fabricating the same | Husam N. Al-Shareef, Randhir P. S. Thakur | 2004-01-06 |