Issued Patents All Time
Showing 76–100 of 122 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6429151 | Semiconductor wafer assemblies comprising silicon nitride, methods of forming silicon nitride, and methods of reducing stress on semiconductive wafers | John T. Moore, Mark Fischer | 2002-08-06 |
| 6426306 | Barrier layer fabrication methods | Randhir P. S. Thakur | 2002-07-30 |
| 6423649 | Method and apparatus for stabilizing high pressure oxidation of a semiconductor device | Daniel Gealy, Dave Chapek, Husam N. Al-Shareef, Randhir P. S. Thakur | 2002-07-23 |
| 6417559 | Semiconductor wafer assemblies comprising photoresist over silicon nitride materials | John T. Moore, Mark Fischer, J. Brett Rolfson, Annette L. Martin, Ardavan Niroomand | 2002-07-09 |
| 6404005 | Methods of forming capacitors and related integrated circuitry | Klaus Schuegraf, Randhir P. S. Thakur | 2002-06-11 |
| 6400552 | Capacitor with conductively doped Si-Ge alloy electrode | Husam N. Al-Shareef, F. Daniel Gealy, Randhir P. S. Thakur | 2002-06-04 |
| 6399459 | Double layer electrode and barrier system on hemispherical grain silicon for use with high dielectric constant materials and methods for fabricating the same | Husam N. Al-Shareef, Randhir P. S. Thakur | 2002-06-04 |
| 6391710 | Methods of forming capacitors | John T. Moore, Guy T. Blalock | 2002-05-21 |
| 6368962 | Semiconductor processing method of forming a conductive line, and buried bit line memory circuitry | Yongjun Jeff Hu, Pai-Hung Pan | 2002-04-09 |
| 6365453 | Method and structure for reducing contact aspect ratios | Vishnu K. Agarwal | 2002-04-02 |
| 6365519 | Batch processing for semiconductor wafers to form aluminum nitride and titanium aluminum nitride | Brenda D. Kraus, John T. Moore | 2002-04-02 |
| 6340613 | Structural integrity enhancement of dielectric films | — | 2002-01-22 |
| 6337274 | Methods of forming buried bit line memory circuitry | Yongjun Jeff Hu, Pai-Hung Pan | 2002-01-08 |
| 6325017 | Apparatus for forming a high dielectric film | Randhir P. S. Thakur | 2001-12-04 |
| 6326321 | Methods of forming a layer of silicon nitride in semiconductor fabrication processes | John T. Moore, Mark Fischer, Randhir P. S. Thakur | 2001-12-04 |
| 6326277 | Methods of forming recessed hemispherical grain silicon capacitor structures | — | 2001-12-04 |
| 6323139 | Semiconductor processing methods of forming photoresist over silicon nitride materials | John T. Moore, Mark Fischer, J. Brett Rolfson, Annette L. Martin, Ardavan Niroomand | 2001-11-27 |
| 6316800 | Boride electrodes and barriers for cell dielectrics | Husam N. Al-Shareef, Dan Gealy, Randhir P. S. Thakur | 2001-11-13 |
| 6316372 | Methods of forming a layer of silicon nitride in a semiconductor fabrication process | John T. Moore, Randhir P. S. Thakur, Mark Fischer | 2001-11-13 |
| 6300253 | Semiconductor processing methods of forming photoresist over silicon nitride materials, and semiconductor wafer assemblies comprising photoresist over silicon nitride materials | John T. Moore, Mark Fischer | 2001-10-09 |
| 6300671 | Semiconductor wafer assemblies comprising photoresist over silicon nitride materials | John T. Moore, Mark Fischer | 2001-10-09 |
| 6291364 | Method and apparatus for stabilizing high pressure oxidation of a semiconductor device | F. Daniel Gealy, Dave Chapek, Husam N. Al-Shareef, Randhir P. S. Thakur | 2001-09-18 |
| 6281543 | Double layer electrode and barrier system on hemispherical grain silicon for use with high dielectric constant materials and methods for fabricating the same | Husam N. Al-Shareef, Randhir P. S. Thakur | 2001-08-28 |
| 6282080 | Semiconductor circuit components and capacitors | F. Daniel Gealy, Randhir P. S. Thakur | 2001-08-28 |
| 6258729 | Oxide etching method and structures resulting from same | Terry L. Gilton, Ceredig Roberts | 2001-07-10 |