SD

Scott DeBoer

Micron: 120 patents #113 of 6,345Top 2%
📍 Boise, ID: #58 of 3,546 inventorsTop 2%
🗺 Idaho: #76 of 8,810 inventorsTop 1%
Overall (All Time): #9,678 of 4,157,543Top 1%
122
Patents All Time

Issued Patents All Time

Showing 101–122 of 122 patents

Patent #TitleCo-InventorsDate
6251720 High pressure reoxidation/anneal of high dielectric constant materials Randhir P. S. Thakur 2001-06-26
6251802 Methods of forming carbon-containing layers John T. Moore, Guy T. Blalock 2001-06-26
6222222 Methods of forming capacitors and related integrated circuitry Klaus Schuegraf, Randhir P. S. Thakur 2001-04-24
6218293 Batch processing for semiconductor wafers to form aluminum nitride and titanium aluminum nitride Brenda D. Kraus, John T. Moore 2001-04-17
6204143 Method of forming high aspect ratio structures for semiconductor devices Ceredig Roberts 2001-03-20
6194321 Semiconductor processing methods utilizing boron and nitrogen, and semiconductor wafers comprising boron and nitrogen John T. Moore 2001-02-27
6191443 Capacitors, methods of forming capacitors, and DRAM memory cells Husam N. Al-Shareef, F. Daniel Gealy, Randhir P. S. Thakur 2001-02-20
6180481 Barrier layer fabrication methods Randhir P. S. Thakur 2001-01-30
6162744 Method of forming capacitors having high-K oxygen containing capacitor dielectric layers, method of processing high-K oxygen containing dielectric layers, method of forming a DRAM cell having having high-K oxygen containing capacitor dielectric layers Husam N. Al-Shareef, Randhir P. S. Thakur 2000-12-19
6150208 DRAM capacitors made from silicon-germanium and electrode-limited conduction dielectric films Klaus Schuegraf, Ronald A. Weimer, Randhir P. S. Thakur 2000-11-21
6146959 Method of forming capacitors containing tantalum F. Daniel Gealy, Randhir P. S. Thakur 2000-11-14
6111285 Boride electrodes and barriers for cell dielectrics Husam N. Al-Shareef, Dan Gealy, Randhir P. S. Thakur 2000-08-29
6093956 Semiconductor wafer assemblies comprising silicon nitride, methods of forming silicon nitride, and methods of reducing stress on semiconductive wafers John T. Moore, Mark Fischer 2000-07-25
6090723 Conditioning of dielectric materials Randhir P. S. Thakur 2000-07-18
6082375 Method of processing internal surfaces of a chemical vapor deposition reactor F. Daniel Gealy, Husam N. Al-Shareef 2000-07-04
6015997 Semiconductor structure having a doped conductive layer Yongjun Jeff Hu, Pai-Hung Pan, Er-Xuan Ping, Randhir P. S. Thakur 2000-01-18
5989338 Method for depositing cell nitride with improved step coverage using MOCVD in a wafer deposition system Randhir P. S. Thakur 1999-11-23
5985771 Semiconductor wafer assemblies comprising silicon nitride, methods of forming silicon nitride, and methods of reducing stress on semiconductive wafers John T. Moore, Mark Fischer 1999-11-16
5960294 Method of fabricating a semiconductor device utilizing polysilicon grains John K. Zahurak, Randhir P. S. Thakur, Mark Fischer 1999-09-28
5930106 DRAM capacitors made from silicon-germanium and electrode-limited conduction dielectric films Klaus Schuegraf, Ronald A. Weimer, Randhir P. S. Thakur 1999-07-27
5926730 Conductor layer nitridation Yongjun Jeff Hu, Randhir P. S. Thakur 1999-07-20
5910880 Semiconductor circuit components and capacitors F. Daniel Gealy, Randhir P. S. Thakur 1999-06-08