| 12131778 |
Triggering of stronger write pulses in a memory device based on prior read operations |
Zhongyuan Lu |
2024-10-29 |
| 12020743 |
Memory device architecture using multiple physical cells per bit to improve read margin and to alleviate the need for managing demarcation read voltages |
Joseph M. McCrate, Hari Giduturi, Ramin Ghodsi |
2024-06-25 |
| 11978513 |
Generating patterns for memory threshold voltage difference |
Zhongyuan Lu |
2024-05-07 |
| 11868211 |
Error detection and correction in memory |
Joseph M. McCrate |
2024-01-09 |
| 11823745 |
Predicting and compensating for degradation of memory cells |
Zhongyuan Lu |
2023-11-21 |
| 11823761 |
Pre-read in opposite polarity to evaluate read margin |
Zhongyuan Lu |
2023-11-21 |
| 11735258 |
Increase of a sense current in memory |
Zhongyuan Lu, Karthik Sarpatwari |
2023-08-22 |
| 11710517 |
Write operation techniques for memory systems |
Zhongyuan Lu, Christina Papagianni, Hongmei Wang |
2023-07-25 |
| 11711987 |
Memory electrodes and formation thereof |
Joseph M. McCrate |
2023-07-25 |
| 11705195 |
Increase of a sense current in memory |
Zhongyuan Lu |
2023-07-18 |
| 11651825 |
Random value generator |
Zhongyuan Lu, Hongmei Wang |
2023-05-16 |
| 11605418 |
Memory device architecture using multiple physical cells per bit to improve read margin and to alleviate the need for managing demarcation read voltages |
Joseph M. McCrate, Hari Giduturi, Ramin Ghodsi |
2023-03-14 |
| 11568932 |
Read cache for reset read disturb mitigation |
Zhongyuan Lu, Stephen H. Tang |
2023-01-31 |
| 11455210 |
Error detection and correction in memory |
Joseph M. McCrate |
2022-09-27 |
| 11456036 |
Predicting and compensating for degradation of memory cells |
Zhongyuan Lu |
2022-09-27 |
| 11295811 |
Increase of a sense current in memory |
Zhongyuan Lu, Karthik Sarpatwari |
2022-04-05 |
| 11244717 |
Write operation techniques for memory systems |
Zhongyuan Lu, Christina Papagianni, Hongmei Wang |
2022-02-08 |
| 11211122 |
Increase of a sense current in memory |
Zhongyuan Lu |
2021-12-28 |
| 8036016 |
Maintenance process to enhance memory endurance |
Joy Sarker |
2011-10-11 |
| 7855103 |
Wirebond structure and method to connect to a microelectronic die |
Donald Danielson, Patrick M. Paluda, Rajan Naik |
2010-12-21 |
| 7393772 |
Wirebond structure and method to connect to a microelectronic die |
Donald Danielson, Patrick M. Paluda, Rajan Naik |
2008-07-01 |
| 6924554 |
Wirebond structure and method to connect to a microelectronic die |
Donald Danielson, Patrick M. Paluda, Rajan Naik |
2005-08-02 |
| 6683383 |
Wirebond structure and method to connect to a microelectronic die |
Donald Danielson, Patrick M. Paluda, Rajan Naik |
2004-01-27 |
