Issued Patents All Time
Showing 51–75 of 93 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6452846 | Driver circuit for a voltage-pulling device | Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer +2 more | 2002-09-17 |
| 6444558 | Methods of forming and programming junctionless antifuses | Douglas J. Cutter, Fan Ho | 2002-09-03 |
| 6445629 | Method of stressing a memory device | Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer +2 more | 2002-09-03 |
| 6418071 | Method of testing a memory cell | Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more | 2002-07-09 |
| 6410955 | Comb-shaped capacitor for use in integrated circuits | R. Jacob Baker | 2002-06-25 |
| 6365421 | Method and apparatus for storage of test results within an integrated circuit | Brett Debenham, Kim Pierce, Douglas J. Cutter, Fan Ho, Patrick J. Mullarkey +6 more | 2002-04-02 |
| 6353564 | Method of testing a memory array | Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more | 2002-03-05 |
| 6351140 | Low current redundancy anti-fuse method and apparatus | Douglas J. Cutter, Fan Ho | 2002-02-26 |
| 6351424 | Cancellation of redundant elements with a cancel bank | Douglas J. Cutter, Fan Ho | 2002-02-26 |
| 6335888 | Margin-range apparatus for a sense amp's voltage-pulling transistor | Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer +2 more | 2002-01-01 |
| 6323536 | Method and apparatus for forming a junctionless antifuse | Douglas J. Cutter, Fan Ho | 2001-11-27 |
| 6262927 | Current saturation test device | Douglas J. Cutter | 2001-07-17 |
| 6255894 | Low current redundancy anti-fuse method and apparatus | Douglas J. Cutter, Fan Ho | 2001-07-03 |
| 6226210 | Method of detecting a short from a digit line pair to ground | Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more | 2001-05-01 |
| 6198676 | Test device | Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer +2 more | 2001-03-06 |
| 6194738 | Method and apparatus for storage of test results within an integrated circuit | Brett Debenham, Kim Pierce, Douglas J. Cutter, Fan Ho, Patrick J. Mullarkey +6 more | 2001-02-27 |
| 6188622 | Method of identifying a defect within a memory circuit | Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more | 2001-02-13 |
| 6185705 | Method and apparatus for checking the resistance of programmable elements | Douglas J. Cutter, Adrian E. Ong, Fan Ho, Brett Debenham, Dien Luong +2 more | 2001-02-06 |
| 6181617 | Method and apparatus for testing a semiconductor device | Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer +2 more | 2001-01-30 |
| 6154410 | Method and apparatus for reducing antifuse programming time | Douglas J. Cutter, Adrian E. Ong, Fan Ho, Patrick J. Mullarkey, Dien Luong +2 more | 2000-11-28 |
| 6154398 | Low current redundancy anti-fuse method and apparatus | Douglas J. Cutter, Fan Ho | 2000-11-28 |
| 6128240 | Cancellation of redundant elements with a cancel bank | Douglas J. Cutter, Fan Ho | 2000-10-03 |
| 6069064 | Method for forming a junctionless antifuse | Douglas J. Cutter, Fan Ho | 2000-05-30 |
| 6052322 | Memory circuit voltage regulator | Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer +2 more | 2000-04-18 |
| 6028799 | Memory circuit voltage regulator | Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more | 2000-02-22 |